Naohiro Ueda

Person

Hyougo-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having metal posts non-overlapping with other...
- Patent number 8,716,874
- Issue date May 6, 2014
- Ricoh Company, Ltd.
- Junichi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,624,677
- Issue date Jan 7, 2014
- Ricoh Company, Ltd.
- Naohiro Ueda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device having a plurality of kinds of wells and manuf...
- Patent number 8,003,476
- Issue date Aug 23, 2011
- Ricoh Company, Ltd.
- Masaaki Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress-distribution detecting semiconductor package group and detec...
- Patent number 7,934,429
- Issue date May 3, 2011
- Ricoh Company, Ltd.
- Naohiro Ueda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor MOS transistor device
- Patent number 7,928,445
- Issue date Apr 19, 2011
- Ricoh Company, Ltd.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,915,655
- Issue date Mar 29, 2011
- Ricoh Company, Ltd.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,871,867
- Issue date Jan 18, 2011
- Ricoh Company, Ltd.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus integrating an electrical device under an e...
- Patent number 7,755,195
- Issue date Jul 13, 2010
- Ricoh Company, Ltd.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress-distribution detecting semiconductor package group and detec...
- Patent number 7,735,375
- Issue date Jun 15, 2010
- Ricoh Company, Ltd.
- Naohiro Ueda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,476,947
- Issue date Jan 13, 2009
- Ricoh Company, Ltd.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a plurality of kinds of wells and manuf...
- Patent number 7,405,460
- Issue date Jul 29, 2008
- Ricoh Company, Ltd.
- Masaaki Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming semiconductor integrated device
- Patent number 7,208,359
- Issue date Apr 24, 2007
- Ricoh Company, Ltd.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device placing high, medium, and low voltage transist...
- Patent number 7,084,035
- Issue date Aug 1, 2006
- Ricoh Company, Ltd.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated device
- Patent number 6,917,081
- Issue date Jul 12, 2005
- Ricoh Company, Ltd.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference voltage generation circuit having reduced temperature sen...
- Patent number 6,590,445
- Issue date Jul 8, 2003
- Ricoh Company, Ltd.
- Naohiro Ueda
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20120235751
- Publication date Sep 20, 2012
- RICOH COMPANY, LTD.
- Naohiro Ueda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE AND LAYOUT METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20120061828
- Publication date Mar 15, 2012
- RICOH COMPANY, LTD.
- Junichi KONISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NET LIST GENERATION METHOD AND CIRCUIT SIMULATION METHOD
- Publication number 20110185326
- Publication date Jul 28, 2011
- RICOH COMPANY, LTD.
- Naohiro UEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Stress-Distribution Detecting Semiconductor Package Group And Detec...
- Publication number 20100193887
- Publication date Aug 5, 2010
- RICOH COMPANY, LTD.
- Naohiro Ueda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090309146
- Publication date Dec 17, 2009
- RICOH COMPANY, LTD.
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRESS-DISTRIBUTION DETECTING SEMICONDUCTOR PACKAGE GROUP AND DETEC...
- Publication number 20090064791
- Publication date Mar 12, 2009
- RICOH COMPANY, LTD.
- Naohiro Ueda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20090068811
- Publication date Mar 12, 2009
- RICOH COMPANY, LTD.
- Naohiro UEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a plurality of kinds of wells and manuf...
- Publication number 20080268626
- Publication date Oct 30, 2008
- Masaaki Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20060197150
- Publication date Sep 7, 2006
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming semiconductor integrated device
- Publication number 20050221551
- Publication date Oct 6, 2005
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a plurality of kinds of wells and manuf...
- Publication number 20040227192
- Publication date Nov 18, 2004
- Masaaki Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated device
- Publication number 20040075147
- Publication date Apr 22, 2004
- Naohiro Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reference voltage generation circuit having reduced temperature sen...
- Publication number 20020060600
- Publication date May 23, 2002
- Naohiro Ueda
- G05 - CONTROLLING REGULATING

Naohiro Ueda

Person

Patents Grantslast 30 patents

Semiconductor device having metal posts non-overlapping with other...

Semiconductor device

Semiconductor device having a plurality of kinds of wells and manuf...

Stress-distribution detecting semiconductor package group and detec...

Semiconductor MOS transistor device

Semiconductor device

Semiconductor device and method of manufacturing the same

Semiconductor apparatus integrating an electrical device under an e...

Stress-distribution detecting semiconductor package group and detec...

Semiconductor device and method of manufacturing the same

Semiconductor device having a plurality of kinds of wells and manuf...

Method of forming semiconductor integrated device

Semiconductor device placing high, medium, and low voltage transist...

Semiconductor integrated device

Reference voltage generation circuit having reduced temperature sen...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND LAYOUT METHOD OF SEMICONDUCTOR DEVICE

NET LIST GENERATION METHOD AND CIRCUIT SIMULATION METHOD

Stress-Distribution Detecting Semiconductor Package Group And Detec...

SEMICONDUCTOR DEVICE

STRESS-DISTRIBUTION DETECTING SEMICONDUCTOR PACKAGE GROUP AND DETEC...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor device having a plurality of kinds of wells and manuf...

Semiconductor device and method of manufacturing the same

Method of forming semiconductor integrated device

Semiconductor device having a plurality of kinds of wells and manuf...

Semiconductor integrated device

Reference voltage generation circuit having reduced temperature sen...