Naohisa Nishioka

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Sagamihara, JP

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Patents Grantslast 30 patents

Information Patent Grant
TSV auto repair scheme on stacked die
- Patent number 11,380,414
- Issue date Jul 5, 2022
- Micron Technology, Inc.
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Grant
Plurality of edge through-silicon vias and related systems, methods...
- Patent number 11,275,111
- Issue date Mar 15, 2022
- Micron Technology, Inc.
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory core chip having TSVs
- Patent number 11,244,888
- Issue date Feb 8, 2022
- Micron Technology, Inc.
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for TSV resistance and short measurement in...
- Patent number 11,037,843
- Issue date Jun 15, 2021
- Micron Technology, Inc.
- Naohisa Nishioka
- G01 - MEASURING TESTING
Information Patent Grant
TSV auto repair scheme on stacked die
- Patent number 10,930,363
- Issue date Feb 23, 2021
- Micron Technology, Inc.
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory core chip having TSVS
- Patent number 10,916,489
- Issue date Feb 9, 2021
- Micron Technology, Inc.
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for TSV resistance and short measurement in...
- Patent number 10,468,313
- Issue date Nov 5, 2019
- Micron Technology, Inc.
- Naohisa Nishioka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TSV Auto Repair Scheme On Stacked Die
- Publication number 20210193242
- Publication date Jun 24, 2021
- Micron Technology, Inc.
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Core Chip Having TSVS
- Publication number 20210183744
- Publication date Jun 17, 2021
- Micron Technology, Inc.
- Naohisa Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLURALITY OF EDGE THROUGH-SILICON VIAS AND RELATED SYSTEMS, METHODS...
- Publication number 20210088586
- Publication date Mar 25, 2021
- Micron Technology, Inc.
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR TSV RESISTANCE AND SHORT MEASUREMENT IN...
- Publication number 20200051876
- Publication date Feb 13, 2020
- Micron Technology, Inc.
- Naohisa Nishioka
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR TSV RESISTANCE AND SHORT MEASUREMENT IN...
- Publication number 20190096776
- Publication date Mar 28, 2019
- Micron Technology, Inc.
- Naohisa Nishioka
- G01 - MEASURING TESTING