Naohito KOHASHI

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of semiconductor device protection
- Patent number 8,268,670
- Issue date Sep 18, 2012
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor device packaging structure
- Patent number 8,164,181
- Issue date Apr 24, 2012
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Component for testing device for electronic component and testing m...
- Patent number 7,977,961
- Issue date Jul 12, 2011
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control method and temperature control device
- Patent number 7,921,906
- Issue date Apr 12, 2011
- Fujitsu Semiconductor Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor and test method using contactor
- Patent number 7,825,676
- Issue date Nov 2, 2010
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of semiconductor device protection, package of semiconductor...
- Patent number 7,807,481
- Issue date Oct 5, 2010
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Contactor for electronic parts and a contact method
- Patent number 7,471,096
- Issue date Dec 30, 2008
- Fujitsu Limited
- Naohito Kohashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device protection cover, and semiconductor device uni...
- Patent number 7,382,046
- Issue date Jun 3, 2008
- Fujitsu Limited
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handling apparatus and test set using the handling apparatus
- Patent number 6,784,657
- Issue date Aug 31, 2004
- Fujitsu Limited
- Keiji Fujishiro
- G01 - MEASURING TESTING
Information Patent Grant
Contactor, method for manufacturing such contactor, and testing met...
- Patent number 6,767,219
- Issue date Jul 27, 2004
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF SEMICONDUCTOR DEVICE PROTECTION
- Publication number 20120005875
- Publication date Jan 12, 2012
- FUJITSU SEMICONDUCTOR LIMITED
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF SEMICONDUCTOR DEVICE PROTECTION, PACKAGE OF SEMICONDUCTOR...
- Publication number 20110049699
- Publication date Mar 3, 2011
- FUJITSU SEMICONDUCTOR LIMITED
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPONENT FOR TESTING DEVICE FOR ELECTRONIC COMPONENT AND TESTING M...
- Publication number 20090302876
- Publication date Dec 10, 2009
- Fujitsu Microelectronics Limited
- Daisuke KOIZUMI
- G01 - MEASURING TESTING
Information Patent Application
Method of semiconductor device protection, package of semiconductor...
- Publication number 20080203558
- Publication date Aug 28, 2008
- FUJITSU LIMITED
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contactor and test method using contactor
- Publication number 20070252608
- Publication date Nov 1, 2007
- FUJITSU LIMITED
- Daisuke Koizumi
- G01 - MEASURING TESTING
Information Patent Application
Temperature control method and temperature control device
- Publication number 20060245161
- Publication date Nov 2, 2006
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Contactor for electronic parts and a contact method
- Publication number 20060186905
- Publication date Aug 24, 2006
- Fujitsu Limited
- Naohito Kohashi
- G01 - MEASURING TESTING
Information Patent Application
Method of semiconductor device protection, package of semiconductor...
- Publication number 20050072972
- Publication date Apr 7, 2005
- FUJITSU LIMITED
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Handling apparatus and test set using the handling apparatus
- Publication number 20030222636
- Publication date Dec 4, 2003
- FUJITSU LIMITED
- Keiji Fujishiro
- G01 - MEASURING TESTING
Information Patent Application
Contactor, method for manufacturing such contactor, and testing met...
- Publication number 20030186566
- Publication date Oct 2, 2003
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING

Naohito KOHASHI

Person

Patents Grantslast 30 patents

Method of semiconductor device protection

Semiconductor device packaging structure

Component for testing device for electronic component and testing m...

Temperature control method and temperature control device

Contactor and test method using contactor

Method of semiconductor device protection, package of semiconductor...

Contactor for electronic parts and a contact method

Semiconductor device protection cover, and semiconductor device uni...

Handling apparatus and test set using the handling apparatus

Contactor, method for manufacturing such contactor, and testing met...

Patents Applicationslast 30 patents

METHOD OF SEMICONDUCTOR DEVICE PROTECTION

METHOD OF SEMICONDUCTOR DEVICE PROTECTION, PACKAGE OF SEMICONDUCTOR...

COMPONENT FOR TESTING DEVICE FOR ELECTRONIC COMPONENT AND TESTING M...

Method of semiconductor device protection, package of semiconductor...

Contactor and test method using contactor

Temperature control method and temperature control device

Contactor for electronic parts and a contact method

Method of semiconductor device protection, package of semiconductor...

Handling apparatus and test set using the handling apparatus

Contactor, method for manufacturing such contactor, and testing met...