Naoji Mitani

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Nagasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Position measuring method
- Patent number 8,130,386
- Issue date Mar 6, 2012
- Sumco Techxiv Corporation
- Toshio Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device and position measuring method in semicond...
- Patent number 8,115,908
- Issue date Feb 14, 2012
- Sumco Techxiv Corporation
- Toshio Hayashida
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR SINGLE CRYSTAL PRODUCTION APPARATUS
- Publication number 20100212588
- Publication date Aug 26, 2010
- SUMCO TECHXIV CORPORATION
- Ayumi Suda
- C30 - CRYSTAL GROWTH