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Naokatsu Ikegami
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Saitama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of fabricating semiconductor device including forming a prot...
Patent number
7,622,394
Issue date
Nov 24, 2009
Oki Semiconductor Co., Ltd.
Naokatsu Ikegami
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Acceleration sensor manufacturable by simplified method
Patent number
7,509,858
Issue date
Mar 31, 2009
Oki Semiconductor Co., Ltd.
Naokatsu Ikegami
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of manufacturing MEMS device
Patent number
7,323,354
Issue date
Jan 29, 2008
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of manufacturing a micro-electrical-mechanical system
Patent number
7,153,716
Issue date
Dec 26, 2006
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Accelerometer
Patent number
7,100,448
Issue date
Sep 5, 2006
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing a semiconductor device
Patent number
7,084,069
Issue date
Aug 1, 2006
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device having thin film SOI s...
Patent number
7,029,957
Issue date
Apr 18, 2006
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Acceleration sensor
Patent number
7,004,030
Issue date
Feb 28, 2006
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing semiconductor device having thin film SOI s...
Patent number
6,624,010
Issue date
Sep 23, 2003
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing sidewall spacers of a semiconductor device...
Patent number
6,500,745
Issue date
Dec 31, 2002
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming via hole by dry etching
Patent number
6,413,438
Issue date
Jul 2, 2002
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Method of dry etching organic SOG film
Patent number
6,355,572
Issue date
Mar 12, 2002
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming contact hole by dry etching
Patent number
6,200,735
Issue date
Mar 13, 2001
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for testing semiconductor device
Patent number
6,037,588
Issue date
Mar 14, 2000
Oki Electric Industry Co., Ltd.
Guo-Lin Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Piezoresistance element and semiconductor device having the same
Publication number
20070215966
Publication date
Sep 20, 2007
Oki Electric Industry Co., Ltd.
Naokatsu Ikegami
G01 - MEASURING TESTING
Information
Patent Application
Method of fabricating semiconductor device
Publication number
20060223324
Publication date
Oct 5, 2006
Naokatsu Ikegami
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Acceleration sensor manufactureable by simplified method
Publication number
20060130580
Publication date
Jun 22, 2006
Naokatsu Ikegami
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Method of manufacturing a micro-electrical-mechanical system
Publication number
20050266599
Publication date
Dec 1, 2005
Naokatsu Ikegami
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Method of manufacturing MEMS device
Publication number
20050236682
Publication date
Oct 27, 2005
Naokatsu Ikegami
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Accelerometer
Publication number
20050097958
Publication date
May 12, 2005
Naokatsu Ikegami
G01 - MEASURING TESTING
Information
Patent Application
Acceleration sensor
Publication number
20050097960
Publication date
May 12, 2005
Naokatsu Ikegami
G01 - MEASURING TESTING
Information
Patent Application
Method of manufacturing semiconductor device having thin film SOI s...
Publication number
20050019991
Publication date
Jan 27, 2005
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of dry etching organic SOG film
Publication number
20040092111
Publication date
May 13, 2004
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing semiconductor device having thin film SOI s...
Publication number
20030113958
Publication date
Jun 19, 2003
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing a semiconductor device
Publication number
20030040190
Publication date
Feb 27, 2003
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of dry etching organic SOG film
Publication number
20020094695
Publication date
Jul 18, 2002
Naokatsu Ikegami
H01 - BASIC ELECTRIC ELEMENTS