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Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus using scanning electron microscope
- Patent number 6,953,939
- Issue date Oct 11, 2005
- Sony Corporation
- Tetsuo Abe
- G01 - MEASURING TESTING
Information Patent Grant
System and method for electron beam irradiation
- Patent number 6,831,278
- Issue date Dec 14, 2004
- Sony Corporation
- Masanobu Yamamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Electron beam irradiation apparatus and electron beam irradiating m...
- Patent number 6,737,660
- Issue date May 18, 2004
- Sony Corporation
- Yoshihisa Miura
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for electron beam irradiation
- Patent number 6,734,437
- Issue date May 11, 2004
- Jeol Ltd.
- Setsuo Norioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam scanning device
- Patent number 4,439,681
- Issue date Mar 27, 1984
- Jeol Ltd.
- Setsuo Norioka
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron beam apparatus
- Patent number 4,431,915
- Issue date Feb 14, 1984
- Jeol Ltd.
- Seiichi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Inspection device using scanning electron microscope
- Publication number 20040144928
- Publication date Jul 29, 2004
- Tetsuo Abe
- G01 - MEASURING TESTING
Information Patent Application
System and method for electron beam irradiation
- Publication number 20030178582
- Publication date Sep 25, 2003
- JEOL Ltd.
- Setsuo Norioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam irradiation apparatus and electron beam irradiating m...
- Publication number 20030178581
- Publication date Sep 25, 2003
- Yoshihisa Miura
- G11 - INFORMATION STORAGE
Information Patent Application
System and method for electron beam irradiation
- Publication number 20030116718
- Publication date Jun 26, 2003
- SONY CORPORATION
- Masanobu Yamamoto
- G11 - INFORMATION STORAGE