Naoki Harada

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for temperature measurement
- Patent number 5,213,417
- Issue date May 25, 1993
- NKK Corporation
- Takeo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for temperature measurement
- Patent number 5,088,836
- Issue date Feb 18, 1992
- NKK Corporation
- Takeo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Temperature data producing apparatus for high temperature moving ob...
- Patent number 4,643,587
- Issue date Feb 17, 1987
- Nippon Kokan Kabushiki Kaisha
- Eiichi Makabe
- G01 - MEASURING TESTING
Information Patent Grant
Method for continuously measuring surface temperature of heated ste...
- Patent number 4,553,854
- Issue date Nov 19, 1985
- Nippon Kokan Kabushiki Kaisha
- Takeo Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device and semiconductor sensor
- Publication number 20050212014
- Publication date Sep 29, 2005
- Masahiro Horibe
- G01 - MEASURING TESTING