Naoki Hosogi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and control method of optical system o...
- Patent number 11,222,764
- Issue date Jan 11, 2022
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,741,358
- Issue date Aug 11, 2020
- Jeol Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional image reconstruction method, image processor, and...
- Patent number 10,541,107
- Issue date Jan 21, 2020
- National University Corporation Nagoya University
- Yoshinori Fujiyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method and charged particle beam system
- Patent number 10,014,156
- Issue date Jul 3, 2018
- Jeol Ltd.
- Naoki Hosogi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device and Control Method of Optical System o...
- Publication number 20200343072
- Publication date Oct 29, 2020
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20200013582
- Publication date Jan 9, 2020
- JEOL Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Three-Dimensional Image Reconstruction Method, Image Processor, and...
- Publication number 20170278669
- Publication date Sep 28, 2017
- National University Corporation Nagoya University
- Yoshinori Fujiyoshi
- G01 - MEASURING TESTING
Information Patent Application
Calibration Method and Charged Particle Beam System
- Publication number 20170117116
- Publication date Apr 27, 2017
- JEOL Ltd.
- Naoki Hosogi
- G01 - MEASURING TESTING