Naoki Hosoya

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for testing defect using SEM
- Patent number 9,390,490
- Issue date Jul 12, 2016
- Hitachi High-Technologies Corporation
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method and device therefor
- Patent number 9,311,697
- Issue date Apr 12, 2016
- Hitachi High-Technologies Corporation
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Global alignment using multiple alignment pattern candidates
- Patent number 9,057,873
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Atsushi Miyamoto
- G02 - OPTICS
Information Patent Grant
Defect inspection method, and device thereof
- Patent number 8,853,628
- Issue date Oct 7, 2014
- Hitachi High-Technologies Corporation
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and method for producing image for inspection
- Patent number 8,730,318
- Issue date May 20, 2014
- Hitachi - GE Nuclear Energy, Ltd.
- Kenji Nakahira
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit pattern examining apparatus and circuit pattern examining m...
- Patent number 8,509,516
- Issue date Aug 13, 2013
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and an inspection method for inspecting a circ...
- Patent number 8,121,395
- Issue date Feb 21, 2012
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting defects of circuit patterns
- Patent number 8,111,902
- Issue date Feb 7, 2012
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for analyzing composition of defects
- Patent number 6,870,169
- Issue date Mar 22, 2005
- Hitachi, Ltd.
- Kenji Obara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting defects in a semiconductor wafer
- Patent number 6,792,366
- Issue date Sep 14, 2004
- Hitachi, Ltd.
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting defects in a semiconductor wafer
- Patent number 6,792,367
- Issue date Sep 14, 2004
- Hitachi, Ltd.
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Input circuit of charge transfer device
- Patent number 4,890,307
- Issue date Dec 26, 1989
- Kabushiki Kaisha Toshiba
- Shin-ichi Imai
- G11 - INFORMATION STORAGE
Information Patent Grant
Charge transfer device provided with charge detection circuit of a...
- Patent number 4,800,579
- Issue date Jan 24, 1989
- Kabushiki Kaisha Toshiba
- Shin-ichi Imai
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Inspection Apparatus and Method for Producing Image for Inspection
- Publication number 20140210988
- Publication date Jul 31, 2014
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Kenji NAKAHIRA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
GLOBAL ALIGNMENT USING MULTIPLE ALIGNMENT PATTERN CANDIDATES
- Publication number 20130234019
- Publication date Sep 12, 2013
- Atsushi Miyamoto
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION METHOD, AND DEVICE THEREOF
- Publication number 20130119250
- Publication date May 16, 2013
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND DEVICE THEREFOR
- Publication number 20130108147
- Publication date May 2, 2013
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR TESTING DEFECT USING SEM
- Publication number 20130070078
- Publication date Mar 21, 2013
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Apparatus and Method for Producing Image for Inspection
- Publication number 20120026317
- Publication date Feb 2, 2012
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Kenji NAKAHIRA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND DEVICE FOR DEFECT INSPECTION
- Publication number 20110188735
- Publication date Aug 4, 2011
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT PATTERN EXAMINING APPARATUS AND CIRCUIT PATTERN EXAMINING M...
- Publication number 20110129141
- Publication date Jun 2, 2011
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND AN INSPECTION METHOD FOR INSPECTING A CIRC...
- Publication number 20090226075
- Publication date Sep 10, 2009
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting defects of circuit patterns
- Publication number 20070047800
- Publication date Mar 1, 2007
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and its apparatus for classifying defects
- Publication number 20060078188
- Publication date Apr 13, 2006
- Masaki Kurihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspection
- Publication number 20060078189
- Publication date Apr 13, 2006
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for analyzing composition of defects
- Publication number 20040126909
- Publication date Jul 1, 2004
- Hitachi, Ltd
- Kenji Obara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting defects in a semiconductor wafer
- Publication number 20030109952
- Publication date Jun 12, 2003
- Hitachi, Ltd
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting defects in a semiconductor wafer
- Publication number 20030109070
- Publication date Jun 12, 2003
- Hitachi, Ltd
- Naoki Hosoya
- G06 - COMPUTING CALCULATING COUNTING

Naoki Hosoya

Person

Patents Grantslast 30 patents

Method and device for testing defect using SEM

Inspection method and device therefor

Global alignment using multiple alignment pattern candidates

Defect inspection method, and device thereof

Inspection apparatus and method for producing image for inspection

Circuit pattern examining apparatus and circuit pattern examining m...

Inspection apparatus and an inspection method for inspecting a circ...

Method and apparatus for inspecting defects of circuit patterns

Method and apparatus for analyzing composition of defects

Method and apparatus for inspecting defects in a semiconductor wafer

Method and apparatus for inspecting defects in a semiconductor wafer

Input circuit of charge transfer device

Charge transfer device provided with charge detection circuit of a...

Patents Applicationslast 30 patents

Inspection Apparatus and Method for Producing Image for Inspection

GLOBAL ALIGNMENT USING MULTIPLE ALIGNMENT PATTERN CANDIDATES

DEFECT INSPECTION METHOD, AND DEVICE THEREOF

INSPECTION METHOD AND DEVICE THEREFOR

METHOD AND DEVICE FOR TESTING DEFECT USING SEM

Inspection Apparatus and Method for Producing Image for Inspection

METHOD AND DEVICE FOR DEFECT INSPECTION

CIRCUIT PATTERN EXAMINING APPARATUS AND CIRCUIT PATTERN EXAMINING M...

INSPECTION APPARATUS AND AN INSPECTION METHOD FOR INSPECTING A CIRC...

Method and apparatus for inspecting defects of circuit patterns

Method and its apparatus for classifying defects

Method and apparatus for inspection

Method and apparatus for analyzing composition of defects

Method and apparatus for inspecting defects in a semiconductor wafer

Method and apparatus for inspecting defects in a semiconductor wafer