Naoki Ikeuchi

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Displacement measurement apparatus for microstructure and displceme...
- Patent number 8,141,426
- Issue date Mar 27, 2012
- Tokyo Electron Limited
- Naoki Ikeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for diagnosing abnormal plasma discharge
- Patent number 8,082,124
- Issue date Dec 20, 2011
- Ritsumeikan University
- Takaya Miyano
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device, method and program for inspecting microstructure
- Patent number 7,726,190
- Issue date Jun 1, 2010
- Tokyo Electron Limited
- Toshiyuki Matsumoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Acceleration sensor and inclination-detecting method
- Patent number 7,428,841
- Issue date Sep 30, 2008
- Tokyo Electron Limited
- Muneo Harada
- G01 - MEASURING TESTING
Information Patent Grant
Device for inspecting micro structure, method for inspecting micro...
- Patent number 7,383,732
- Issue date Jun 10, 2008
- Octec Inc.
- Katsuya Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Probing card and inspection apparatus for microstructure
- Patent number 7,348,788
- Issue date Mar 25, 2008
- Tokyo Electron Limited
- Masami Yakabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electrostatic capacitance detection circuit and microphone device
- Patent number 7,034,551
- Issue date Apr 25, 2006
- Tokyo Electron Limited
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Impedance measuring circuit and capacitance measuring circuit
- Patent number 7,023,223
- Issue date Apr 4, 2006
- Tokyo Electron Limited
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic capacitance detection circuit and microphone device
- Patent number 7,019,540
- Issue date Mar 28, 2006
- Tokyo Electron Limited
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit and method for impedance detection
- Patent number 7,005,865
- Issue date Feb 28, 2006
- Tokyo Electron Limited
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Microstructure with movable mass
- Patent number 6,931,928
- Issue date Aug 23, 2005
- Tokyo Electron Limited
- Hiroyuki Hashimoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Vibration wave detector
- Patent number 6,438,243
- Issue date Aug 20, 2002
- Sumitomo Metal Industries Ltd.
- Naoki Ikeuchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Vibration wave detecting method and vibration wave detector
- Patent number 6,223,601
- Issue date May 1, 2001
- Sumitomo Metal Industries, Limited
- Muneo Harada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DIAGNOSING ABNORMAL PLASMA DISCHARGE, ABNORMAL PLASMA DI...
- Publication number 20100161278
- Publication date Jun 24, 2010
- Takaya Miyano
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Displacement Measurement apparatus for microstructure and displceme...
- Publication number 20090145230
- Publication date Jun 11, 2009
- TOKYO ELECTRON LIMITED
- Naoki Ikeuchi
- G01 - MEASURING TESTING
Information Patent Application
Vibration-Wave Detector
- Publication number 20090140612
- Publication date Jun 4, 2009
- Naoki Ikeuchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Microstructure Probe Card, and Microstructure Inspecting Device, Me...
- Publication number 20090128171
- Publication date May 21, 2009
- Katsuya Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROSTRUCTURE INSPECTING APPARATUS AND MICROSTRUCTURE INSPECTING M...
- Publication number 20090039908
- Publication date Feb 12, 2009
- TOKYO ELECTRON LIMITED
- Naoki Ikeuchi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Microstructure Inspecting Apparatus and Microstructure Inspecting M...
- Publication number 20080302185
- Publication date Dec 11, 2008
- Masami Yakabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Minute structure inspection device, inspection method, and inspecti...
- Publication number 20080223136
- Publication date Sep 18, 2008
- TOKYO ELECTRON LIMITED
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
Device, Method and Program for Inspecting Microstructure
- Publication number 20080190206
- Publication date Aug 14, 2008
- TOKYO ELECTRON LIMITED
- Toshiyuki Matsumoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor device having microstructure and method of manufactur...
- Publication number 20070262306
- Publication date Nov 15, 2007
- TOKYO ELECTRON LIMITED
- Naoki Ikeuchi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Probe
- Publication number 20070257692
- Publication date Nov 8, 2007
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
Probing card and inspection apparatus for microstructure
- Publication number 20070069746
- Publication date Mar 29, 2007
- Masami Yakabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Acceleration sensor and inclination-detecting method
- Publication number 20060162450
- Publication date Jul 27, 2006
- Muneo Harada
- G01 - MEASURING TESTING
Information Patent Application
Device for inspecting micro structure, method for inspecting micro...
- Publication number 20050279170
- Publication date Dec 22, 2005
- Katsuya Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Capacitance measuring circuit, capacitance measuring instrument, an...
- Publication number 20050040833
- Publication date Feb 24, 2005
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Impedance measuring circuit, it's method, and capacitance measuring...
- Publication number 20050035771
- Publication date Feb 17, 2005
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Impedance measuring circuit and capacitance measuring circuit
- Publication number 20050030046
- Publication date Feb 10, 2005
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
Microstructure with movable mass
- Publication number 20050016271
- Publication date Jan 27, 2005
- Hiroyuki Hashimoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Capacitance measuring circuit capacitance measuring instrument and...
- Publication number 20050017737
- Publication date Jan 27, 2005
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Naoki Ikeuchi

Person

Patents Grantslast 30 patents

Displacement measurement apparatus for microstructure and displceme...

Method and system for diagnosing abnormal plasma discharge

Device, method and program for inspecting microstructure

Acceleration sensor and inclination-detecting method

Device for inspecting micro structure, method for inspecting micro...

Probing card and inspection apparatus for microstructure

Electrostatic capacitance detection circuit and microphone device

Impedance measuring circuit and capacitance measuring circuit

Electrostatic capacitance detection circuit and microphone device

Circuit and method for impedance detection

Microstructure with movable mass

Vibration wave detector

Vibration wave detecting method and vibration wave detector

Patents Applicationslast 30 patents

METHOD FOR DIAGNOSING ABNORMAL PLASMA DISCHARGE, ABNORMAL PLASMA DI...

Displacement Measurement apparatus for microstructure and displceme...

Vibration-Wave Detector

Microstructure Probe Card, and Microstructure Inspecting Device, Me...

MICROSTRUCTURE INSPECTING APPARATUS AND MICROSTRUCTURE INSPECTING M...

Microstructure Inspecting Apparatus and Microstructure Inspecting M...

Minute structure inspection device, inspection method, and inspecti...

Device, Method and Program for Inspecting Microstructure

Semiconductor device having microstructure and method of manufactur...

Probe

Probing card and inspection apparatus for microstructure

Acceleration sensor and inclination-detecting method

Device for inspecting micro structure, method for inspecting micro...

Capacitance measuring circuit, capacitance measuring instrument, an...

Impedance measuring circuit, it's method, and capacitance measuring...

Impedance measuring circuit and capacitance measuring circuit

Microstructure with movable mass

Capacitance measuring circuit capacitance measuring instrument and...