Naoki Kamo

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Sapporo City, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope
- Patent number 6,655,196
- Issue date Dec 2, 2003
- Hokkaido University
- Koichi Mukasa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning probe microscope
- Publication number 20030010099
- Publication date Jan 16, 2003
- HOKKAIDO UNIVERSITY
- Koichi Mukasa
- B82 - NANO-TECHNOLOGY