Naoki Katou

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Nishiwaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Contact probe and probe device
- Patent number 7,015,710
- Issue date Mar 21, 2006
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,937,042
- Issue date Aug 30, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,919,732
- Issue date Jul 19, 2005
- Genesis Technology Incorporation
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,917,211
- Issue date Jul 12, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,903,563
- Issue date Jun 7, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,900,647
- Issue date May 31, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe device
- Patent number 6,710,608
- Issue date Mar 23, 2004
- Mitsubishi Materials Corporation
- Hideaki Yoshida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Contact probe and probe device
- Publication number 20050007130
- Publication date Jan 13, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20050001643
- Publication date Jan 6, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20050001644
- Publication date Jan 6, 2005
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20040160236
- Publication date Aug 19, 2004
- Genesis Technology Incorporated
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Contact probe and probe device
- Publication number 20020186030
- Publication date Dec 12, 2002
- MITSUBISHI MATERIALS CORPORATION
- Hideaki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND PROBE DEVICE
- Publication number 20010019276
- Publication date Sep 6, 2001
- HIDEAKI YOSHIDA
- G01 - MEASURING TESTING