Naoki Kawahara

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray thin film inspection device
- Patent number 10,473,598
- Issue date Nov 12, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Methods for manufacturing doubly bent X-ray focusing device, doubly...
- Patent number 10,175,185
- Issue date Jan 8, 2019
- Rigaku Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer and program used therein
- Patent number 7,961,842
- Issue date Jun 14, 2011
- Rigaku Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer and program used therein
- Patent number 7,187,751
- Issue date Mar 6, 2007
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 6,647,090
- Issue date Nov 11, 2003
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer
- Patent number 6,337,897
- Issue date Jan 8, 2002
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer useable as wavelength dispersive type an...
- Patent number 6,292,532
- Issue date Sep 18, 2001
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzing apparatus with enhanced radiation intensity
- Patent number 6,028,911
- Issue date Feb 22, 2000
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR MANUFACTURING DOUBLY BENT X-RAY FOCUSING DEVICE, DOUBLY...
- Publication number 20180011035
- Publication date Jan 11, 2018
- Rigaku Corporation
- Naoki KAWAHARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY THIN FILM INSPECTION DEVICE
- Publication number 20170234814
- Publication date Aug 17, 2017
- RIGAKU CORPORATION
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN
- Publication number 20090041184
- Publication date Feb 12, 2009
- RIGAKU INDUSTRIAL CORPORATION
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN
- Publication number 20060274882
- Publication date Dec 7, 2006
- RIGAKU INDUSTRIAL CORPORATION
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometer for semiconductors
- Publication number 20030142781
- Publication date Jul 31, 2003
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometer
- Publication number 20020172322
- Publication date Nov 21, 2002
- Naoki Kawahara
- G01 - MEASURING TESTING

Naoki Kawahara

Person

Patents Grantslast 30 patents

X-ray thin film inspection device

Methods for manufacturing doubly bent X-ray focusing device, doubly...

X-ray fluorescence spectrometer and program used therein

X-ray fluorescence spectrometer and program used therein

X-ray fluorescence spectrometer

Fluorescent X-ray analyzer

Fluorescent X-ray analyzer useable as wavelength dispersive type an...

X-ray analyzing apparatus with enhanced radiation intensity

Patents Applicationslast 30 patents

METHODS FOR MANUFACTURING DOUBLY BENT X-RAY FOCUSING DEVICE, DOUBLY...

X-RAY THIN FILM INSPECTION DEVICE

X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN

X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN

X-ray fluorescence spectrometer for semiconductors

X-ray fluorescence spectrometer