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Naoki Kiryu
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-test method for using compare MISR
Patent number
7,631,237
Issue date
Dec 8, 2009
Kabushiki Kaisha Toshiba
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for circuit testing using LBIST
Patent number
7,627,798
Issue date
Dec 1, 2009
Kabushiki Kaisha Toshiba
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for accelerating through-the-pins LBIST simulation
Patent number
7,478,304
Issue date
Jan 13, 2009
International Business Machines Corporation
Tilman Gloekler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for accelerating through-the pins LBIST simula...
Patent number
7,350,124
Issue date
Mar 25, 2008
International Business Machines Corporation
Tilman Gloekler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for LBIST testing using multiple functional sub...
Patent number
7,308,634
Issue date
Dec 11, 2007
Kabushiki Kaisha Toshiba
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Grant
Programmable scan shift speed control for LBIST
Patent number
7,266,745
Issue date
Sep 4, 2007
Kabushiki Kaisha Toshiba
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for burn-in test control
Patent number
7,103,495
Issue date
Sep 5, 2006
Kabushiki Kaisha Toshiba
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Grant
Circuit apparatus and method for testing integrated circuits using...
Patent number
7,080,298
Issue date
Jul 18, 2006
Toshiba America Electronic Components
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for circuit testing
Patent number
7,055,077
Issue date
May 30, 2006
Kabushiki Kaisha Toshiba
Naoki Kiryu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and Apparatus for Accelerating Through-the-Pins LBIST Simula...
Publication number
20080097739
Publication date
Apr 24, 2008
Tilman Gloekler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for accelerating through-the pins LBIST simula...
Publication number
20070089004
Publication date
Apr 19, 2007
Tilman Gloekler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Multi-test method for using compare MISR
Publication number
20060282732
Publication date
Dec 14, 2006
Toshiba America Electronic Components
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Application
Systems and methods for LBIST testing using multiple functional sub...
Publication number
20060236181
Publication date
Oct 19, 2006
Toshiba America Electronic Components
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Application
Programmable scan shift speed control for LBIST
Publication number
20060174178
Publication date
Aug 3, 2006
Toshiba America Electronic Components
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Application
Systems and methods for circuit testing using LBIST
Publication number
20060080585
Publication date
Apr 13, 2006
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Application
System and method for burn-in test control
Publication number
20060064265
Publication date
Mar 23, 2006
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Application
Systems and methods for circuit testing
Publication number
20050138509
Publication date
Jun 23, 2005
Naoki Kiryu
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for testing integrated circuits using weighted...
Publication number
20040153916
Publication date
Aug 5, 2004
Naoki Kiryu
G01 - MEASURING TESTING