Naoki Kiryu

Person

Machida City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, semiconductor package and memory repair method
- Patent number 8,208,325
- Issue date Jun 26, 2012
- Kabushiki Kaisha Toshiba
- Yukihiro Urakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Data transfer circuit
- Patent number 8,130,570
- Issue date Mar 6, 2012
- Kabushiki Kaisha Toshiba
- Akihiko Fukui
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing a ring of non-scan latches with lo...
- Patent number 7,797,600
- Issue date Sep 14, 2010
- International Business Machines Corporation
- Louis B. Bushard
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for improved fault coverage of LBIST testing
- Patent number 7,681,098
- Issue date Mar 16, 2010
- Kabushiki Kaisha Toshiba
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for identifying errors in LBIST testing
- Patent number 7,558,996
- Issue date Jul 7, 2009
- Kabushiki Kaisha Toshiba
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for LBIST testing using isolatable scan chains
- Patent number 7,484,153
- Issue date Jan 27, 2009
- Kabushiki Kaisha Toshiba
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for diagnosing rate dependent errors using LBIST
- Patent number 7,475,311
- Issue date Jan 6, 2009
- Kabushiki Kaisha Toshiba
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for providing output data in an LBIST system ha...
- Patent number 7,461,309
- Issue date Dec 2, 2008
- Kabushiki Kaisha Toshiba
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a ring of non-scan latches with lo...
- Patent number 7,406,640
- Issue date Jul 29, 2008
- International Business Machines Corporation
- Louis Bernard Bushard
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DATA TRANSFER CIRCUIT
- Publication number 20110075494
- Publication date Mar 31, 2011
- Kabushiki Kaisha Toshiba
- Akihiko Fukui
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR PACKAGE AND MEMORY REPAIR METHOD
- Publication number 20100195425
- Publication date Aug 5, 2010
- Kabushiki Kaisha Toshiba
- Yukihiro Urakawa
- G11 - INFORMATION STORAGE
Information Patent Application
Method and Apparatus for Testing a Ring of Non-Scan Latches with Lo...
- Publication number 20080250290
- Publication date Oct 9, 2008
- International Business Machines Corporation
- Louis Bernard Bushard
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Improved Fault Coverage of LBIST Testing
- Publication number 20070273401
- Publication date Nov 29, 2007
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING A RING OF NON-SCAN LATCHES WITH LO...
- Publication number 20070234159
- Publication date Oct 4, 2007
- LOUIS BERNARD BUSHARD
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for identifying errors in LBIST testing
- Publication number 20070220383
- Publication date Sep 20, 2007
- Toshiba America Electronic Components
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for managing power supplied to integrated circuits
- Publication number 20070188186
- Publication date Aug 16, 2007
- Toshiba America Electronic Components
- Naoki Kiryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and methods for LBIST testing using commonly controlled LBI...
- Publication number 20070168809
- Publication date Jul 19, 2007
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for providing output data in an LBIST system ha...
- Publication number 20070143651
- Publication date Jun 21, 2007
- Toshiba America Electronic Components
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for LBIST testing using isolatable scan chains
- Publication number 20070130489
- Publication date Jun 7, 2007
- Toshiba America Electronic Components, IBM
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for diagnosing rate dependent errors using LBIST
- Publication number 20070050693
- Publication date Mar 1, 2007
- Toshiba America Electronic Components
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for self-diagnosing LBIST
- Publication number 20070011537
- Publication date Jan 11, 2007
- Toshiba America Electronic Components
- Naoki Kiryu
- G01 - MEASURING TESTING

Naoki Kiryu

Person

Patents Grantslast 30 patents

Semiconductor device, semiconductor package and memory repair method

Data transfer circuit

Method and apparatus for testing a ring of non-scan latches with lo...

Systems and methods for improved fault coverage of LBIST testing

Systems and methods for identifying errors in LBIST testing

Systems and methods for LBIST testing using isolatable scan chains

Systems and methods for diagnosing rate dependent errors using LBIST

Systems and methods for providing output data in an LBIST system ha...

Method and apparatus for testing a ring of non-scan latches with lo...

Patents Applicationslast 30 patents

DATA TRANSFER CIRCUIT

SEMICONDUCTOR DEVICE, SEMICONDUCTOR PACKAGE AND MEMORY REPAIR METHOD

Method and Apparatus for Testing a Ring of Non-Scan Latches with Lo...

Systems and Methods for Improved Fault Coverage of LBIST Testing

METHOD AND APPARATUS FOR TESTING A RING OF NON-SCAN LATCHES WITH LO...

Systems and methods for identifying errors in LBIST testing

Systems and methods for managing power supplied to integrated circuits

Systems and methods for LBIST testing using commonly controlled LBI...

Systems and methods for providing output data in an LBIST system ha...

Systems and methods for LBIST testing using isolatable scan chains

Systems and methods for diagnosing rate dependent errors using LBIST

Systems and methods for self-diagnosing LBIST