Naoki MIYAZAKI

Person

  • Musashino-shi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor test system

    • Patent number 7,849,375
    • Issue date Dec 7, 2010
    • Yokogawa Electric Corporation
    • Fumihiro Saito
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR TEST SYSTEM

    • Publication number 20080301512
    • Publication date Dec 4, 2008
    • Yokogawa Electric Corporation
    • Fumihiro SAITO
    • G06 - COMPUTING CALCULATING COUNTING