Naoki Muramatsu

Person

Nirasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection system
- Patent number 12,117,485
- Issue date Oct 15, 2024
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 11,762,012
- Issue date Sep 19, 2023
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 11,567,123
- Issue date Jan 31, 2023
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system, wafer inspection apparatus and prober
- Patent number 11,061,071
- Issue date Jul 13, 2021
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Test head and wafer inspection apparatus
- Patent number 10,976,364
- Issue date Apr 13, 2021
- Tokyo Electron Limited
- Junichi Hagihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer inspection system, wafer inspection apparatus and prober
- Patent number 10,753,972
- Issue date Aug 25, 2020
- Tokyo Electron Limited
- Junichi Hagihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Maintenance carriage for wafer inspection apparatus and maintenance...
- Patent number 9,671,459
- Issue date Jun 6, 2017
- Tokyo Electron Limited
- Junichi Hagihara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20240019487
- Publication date Jan 18, 2024
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20230134360
- Publication date May 4, 2023
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20210190861
- Publication date Jun 24, 2021
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER
- Publication number 20200400743
- Publication date Dec 24, 2020
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Application
TEST HEAD AND WAFER INSPECTION APPARATUS
- Publication number 20200348358
- Publication date Nov 5, 2020
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER
- Publication number 20200064400
- Publication date Feb 27, 2020
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER
- Publication number 20170234924
- Publication date Aug 17, 2017
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Application
MAINTENANCE CARRIAGE FOR WAFER INSPECTION APPARATUS AND MAINTENANCE...
- Publication number 20150115991
- Publication date Apr 30, 2015
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- G01 - MEASURING TESTING

Naoki Muramatsu

Person

Patents Grantslast 30 patents

Wafer inspection system

Wafer inspection system

Wafer inspection system

Wafer inspection system, wafer inspection apparatus and prober

Test head and wafer inspection apparatus

Wafer inspection system, wafer inspection apparatus and prober

Maintenance carriage for wafer inspection apparatus and maintenance...

Patents Applicationslast 30 patents

WAFER INSPECTION SYSTEM

WAFER INSPECTION SYSTEM

WAFER INSPECTION SYSTEM

WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER

TEST HEAD AND WAFER INSPECTION APPARATUS

WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER

WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER

MAINTENANCE CARRIAGE FOR WAFER INSPECTION APPARATUS AND MAINTENANCE...