Naoki Nagatani

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Ishikawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analytical method and analytical apparatus
- Patent number 8,110,406
- Issue date Feb 7, 2012
- Japan Advanced Institute of Science and Technology
- Eiichi Tamiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Determination of Test Substance
- Publication number 20090159458
- Publication date Jun 25, 2009
- Bio Device Technology Ltd.
- Eiichi Tamiya
- G01 - MEASURING TESTING
Information Patent Application
Analytical Method and Analytical Apparatus
- Publication number 20090047746
- Publication date Feb 19, 2009
- Japan Science and Technology Agency
- Eiichi Tamiya
- G01 - MEASURING TESTING