Naoki OTANI

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Birefringence measurement device and birefringence measurement method
- Patent number 10,119,904
- Issue date Nov 6, 2018
- National Institute of Advanced Industrial Science
- Akira Emoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Birefringence Measurement Device and Birefringence Measurement Method
- Publication number 20170276597
- Publication date Sep 28, 2017
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Akira EMOTO
- G01 - MEASURING TESTING