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Naoki Shindo
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Akashi-Shi, JP
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last 30 patents
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Patent Grant
Sample analyzing system, sample analyzer and management apparatus
Patent number
8,868,370
Issue date
Oct 21, 2014
Sysmex Corporation
Naoki Shindo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SAMPLE ANALYZING SYSTEM, SAMPLE ANALYZER AND MANAGEMENT APPARATUS
Publication number
20120078514
Publication date
Mar 29, 2012
Naoki Shindo
G06 - COMPUTING CALCULATING COUNTING