Naoko Hirose

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Focused ion beam apparatus, and control method for focused ion beam...
- Patent number 11,257,655
- Issue date Feb 22, 2022
- Hitachi High-Tech Science Corporation
- Yasuhiko Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus and control method thereof
- Patent number 11,017,982
- Issue date May 25, 2021
- Hitachi High-Tech Science Corporation
- Yasuhiko Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FOCUSED ION BEAM APPARATUS, AND CONTROL METHOD FOR FOCUSED ION BEAM...
- Publication number 20210118642
- Publication date Apr 22, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yasuhiko SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20200266029
- Publication date Aug 20, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yasuhiko SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS