Membership
Tour
Register
Log in
Naoko Pia Sanda
Follow
Person
Chappaqua, NY, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Testing soft error rate of an application program
Patent number
8,296,739
Issue date
Oct 23, 2012
International Business Machines Corporation
Ronald Nick Kalla
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for testing a full system integrated circuit d...
Patent number
8,073,668
Issue date
Dec 6, 2011
International Business Machines Corporation
Jeffrey William Kellington
G01 - MEASURING TESTING
Information
Patent Grant
System and method for accelerated detection of transient particle i...
Patent number
7,084,660
Issue date
Aug 1, 2006
International Business Machines Corporation
Jerry D. Ackaret
G01 - MEASURING TESTING
Information
Patent Grant
Method and application of PICA (picosecond imaging circuit analysis...
Patent number
6,943,578
Issue date
Sep 13, 2005
International Business Machines Corporation
Naoko Pia Sanda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and Apparatus for Testing Soft Error Rate of an Application...
Publication number
20090249301
Publication date
Oct 1, 2009
International Business Machines Corporation
Ronald Nick Kalla
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Testing a Full System Integrated Circuit D...
Publication number
20090193296
Publication date
Jul 30, 2009
IBM Corporation
Jeffrey William Kellington
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPLICATION OF PICA (PICOSECOND IMAGING CIRCUIT ANALYSIS...
Publication number
20050218921
Publication date
Oct 6, 2005
International Business Machines Corporation
Naoko Pia Sanda
G01 - MEASURING TESTING