Naomi Miyaji

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit contactor, and method and apparatus for producti...
- Patent number 7,174,629
- Issue date Feb 13, 2007
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contactor, and method and apparatus for producti...
- Patent number 6,555,764
- Issue date Apr 29, 2003
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing device
- Patent number 6,191,604
- Issue date Feb 20, 2001
- Fujitsu Limited
- Makoto Haseyama
- G01 - MEASURING TESTING
Information Patent Grant
Test board and a test method using the same providing improved elec...
- Patent number 6,046,598
- Issue date Apr 4, 2000
- Fujitsu Limited
- Naomi Miyaji
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing a packaged semiconductor having a divided...
- Patent number 5,804,468
- Issue date Sep 8, 1998
- Fujitsu Limited
- Kazuto Tsuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and lead frame therefore
- Patent number 5,497,032
- Issue date Mar 5, 1996
- Fujitsu Limited
- Kazuto Tsuji
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit contactor, and method and apparatus for producti...
- Publication number 20030132027
- Publication date Jul 17, 2003
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING