Naomi Miyake

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card and semiconductor wafer inspection method using the same
- Patent number 8,659,312
- Issue date Feb 25, 2014
- Panasonic Corporation
- Yoshirou Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Probe, electronic device test apparatus, and method of producing th...
- Patent number 8,598,902
- Issue date Dec 3, 2013
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor IC and testing method thereof
- Patent number 7,673,205
- Issue date Mar 2, 2010
- Panasonic Corporation
- Naomi Miyake
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method for semiconductor IC
- Patent number 7,589,546
- Issue date Sep 15, 2009
- Panasonic Corporation
- Naomi Miyake
- G01 - MEASURING TESTING
Information Patent Grant
Redundant memory cell selecting circuit having fuses coupled to mem...
- Patent number 5,953,264
- Issue date Sep 14, 1999
- Matsushita Electric Industrial Co., Ltd.
- Hiroshige Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundant memory cell selecting circuit having fuses coupled to mem...
- Patent number 5,740,114
- Issue date Apr 14, 1998
- Matsushita Electric Industrial Co., Ltd.
- Hiroshige Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
Initial value setting circuit
- Patent number 5,523,710
- Issue date Jun 4, 1996
- Matsushita Electric Industrial Co., Ltd.
- Naomi Miyake
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Reference voltage generator
- Patent number 5,448,159
- Issue date Sep 5, 1995
- Matsushita Electronics Corporation
- Makoto Kojima
- G05 - CONTROLLING REGULATING
Information Patent Grant
Random access memory with redundancy repair circuit
- Patent number 5,282,165
- Issue date Jan 25, 1994
- Matsushita Electric Industrial Co., Ltd.
- Naomi Miyake
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND SEMICONDUCTOR WAFER INSPECTION METHOD USING THE SAME
- Publication number 20110074455
- Publication date Mar 31, 2011
- Yoshirou NAKATA
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and method for semiconductor IC
- Publication number 20090289653
- Publication date Nov 26, 2009
- Panasonic Corporation
- Naomi Miyake
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor IC and testing method thereof
- Publication number 20080098267
- Publication date Apr 24, 2008
- Matsushita Electric Industrial Co., Ltd.
- Naomi Miyake
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and method for semiconductor IC
- Publication number 20070278662
- Publication date Dec 6, 2007
- Matsushita Electric Industrial Co., Ltd.
- Naomi Miyake
- G01 - MEASURING TESTING

Naomi Miyake

Person

Patents Grantslast 30 patents

Probe card and semiconductor wafer inspection method using the same

Probe, electronic device test apparatus, and method of producing th...

Semiconductor IC and testing method thereof

Inspection apparatus and method for semiconductor IC

Redundant memory cell selecting circuit having fuses coupled to mem...

Redundant memory cell selecting circuit having fuses coupled to mem...

Initial value setting circuit

Reference voltage generator

Random access memory with redundancy repair circuit

Patents Applicationslast 30 patents

PROBE CARD AND SEMICONDUCTOR WAFER INSPECTION METHOD USING THE SAME

Inspection apparatus and method for semiconductor IC

Semiconductor IC and testing method thereof

Inspection apparatus and method for semiconductor IC