Naomichi CHIDA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Displacement sensor
- Patent number 10,634,489
- Issue date Apr 28, 2020
- Yokogawa Electric Corporation
- Naomichi Chida
- G02 - OPTICS
Information Patent Grant
Measuring device
- Patent number 10,481,082
- Issue date Nov 19, 2019
- Yokogawa Electric Corporation
- Kazuki Setsuda
- G01 - MEASURING TESTING
Information Patent Grant
Signal detection device and optical characteristics measurement device
- Patent number 10,345,231
- Issue date Jul 9, 2019
- Yokogawa Electric Corporation
- Kazuki Setsuda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Displacement sensor, spectral characteristic measuring apparatus, c...
- Patent number 9,605,949
- Issue date Mar 28, 2017
- Yokogawa Electric Corporation
- Atsushi Tsujii
- G01 - MEASURING TESTING
Information Patent Grant
Displacement sensor, spectral characteristic measuring apparatus, c...
- Patent number 9,488,468
- Issue date Nov 8, 2016
- Yokogawa Electric Corporation
- Atsushi Tsujii
- G01 - MEASURING TESTING
Information Patent Grant
Material property measuring apparatus
- Patent number 9,170,194
- Issue date Oct 27, 2015
- Yokogawa Electric Corporation
- Yasushi Ichizawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring position and shape of pattern formed on sheet
- Patent number 8,823,819
- Issue date Sep 2, 2014
- Yokogawa Electric Corporation
- Yasushi Ichizawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Focus error detecting optical system for a microscope
- Patent number 7,692,856
- Issue date Apr 6, 2010
- Yokogawa Electric Corporation
- Kenta Mikuriya
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
DISPLACEMENT SENSOR
- Publication number 20190078875
- Publication date Mar 14, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Naomichi CHIDA
- G02 - OPTICS
Information Patent Application
MEASURING DEVICE
- Publication number 20190011353
- Publication date Jan 10, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Kazuki Setsuda
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL DETECTION DEVICE AND OPTICAL CHARACTERISTICS MEASUREMENT DEVICE
- Publication number 20180149587
- Publication date May 31, 2018
- YOKOGAWA ELECTRIC CORPORATION
- Kazuki SETSUDA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DISPLACEMENT SENSOR, SPECTRAL CHARACTERISTIC MEASURING APPARATUS, C...
- Publication number 20170023355
- Publication date Jan 26, 2017
- YOKOGAWA ELECTRIC CORPORATION
- Atsushi TSUJII
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL PROPERTY MEASURING APPARATUS
- Publication number 20150090885
- Publication date Apr 2, 2015
- Yokogawa Electric Corporation
- Yasushi Ichizawa
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT SENSOR, SPECTRAL CHARACTERISTIC MEASURING APPARATUS, C...
- Publication number 20140104623
- Publication date Apr 17, 2014
- YOKOGAWA ELECTRIC CORPORATION
- Atsushi TSUJII
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING POSITION AND SHAPE OF PATTERN FORMED ON SHEET
- Publication number 20120081539
- Publication date Apr 5, 2012
- YOKOGAWA ELECTRIC CORPORATION
- Yasushi Ichizawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
POSITION MEASURING SYSTEM
- Publication number 20110273557
- Publication date Nov 10, 2011
- YOKOGAWA ELECTRIC CORPORATION
- Yasushi Ichizawa
- G01 - MEASURING TESTING
Information Patent Application
Microscope
- Publication number 20070236687
- Publication date Oct 11, 2007
- Yokogawa Electric Corporation
- Kenta Mikuriya
- G02 - OPTICS

Naomichi CHIDA

Person

Patents Grantslast 30 patents

Displacement sensor

Measuring device

Signal detection device and optical characteristics measurement device

Displacement sensor, spectral characteristic measuring apparatus, c...

Displacement sensor, spectral characteristic measuring apparatus, c...

Material property measuring apparatus

Apparatus for measuring position and shape of pattern formed on sheet

Focus error detecting optical system for a microscope

Patents Applicationslast 30 patents

DISPLACEMENT SENSOR

MEASURING DEVICE

SIGNAL DETECTION DEVICE AND OPTICAL CHARACTERISTICS MEASUREMENT DEVICE

DISPLACEMENT SENSOR, SPECTRAL CHARACTERISTIC MEASURING APPARATUS, C...

MATERIAL PROPERTY MEASURING APPARATUS

DISPLACEMENT SENSOR, SPECTRAL CHARACTERISTIC MEASURING APPARATUS, C...

APPARATUS FOR MEASURING POSITION AND SHAPE OF PATTERN FORMED ON SHEET

POSITION MEASURING SYSTEM

Microscope