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Naoshi Sakaguchi
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Casting device, method for detecting leakage of refrigerant in cast...
Patent number
10,828,694
Issue date
Nov 10, 2020
Toyota Jidosha Kabushiki Kaisha
Daisuke Serino
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
X-ray inspection device, X-ray inspection method, and method of man...
Patent number
10,809,208
Issue date
Oct 20, 2020
Nikon Corporation
Hirotomo Yashima
G01 - MEASURING TESTING
Information
Patent Grant
X-ray apparatus and structure production method
Patent number
10,571,412
Issue date
Feb 25, 2020
Nikon Corporation
Toshihisa Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray apparatus and structure production method
Patent number
10,533,958
Issue date
Jan 14, 2020
Nikon Corporation
Toshihisa Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray apparatus and structure production method
Patent number
10,502,699
Issue date
Dec 10, 2019
Nikon Corporation
Toshihisa Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Edge inspection apparatus
Patent number
7,800,748
Issue date
Sep 21, 2010
Nikon Corporation
Naoshi Sakaguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CASTING DEVICE, METHOD FOR DETECTING LEAKAGE OF REFRIGERANT IN CAST...
Publication number
20190176221
Publication date
Jun 13, 2019
TOYOTA JIDOSHA KABUSHIKI KAISHA
Daisuke SERINO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION DEVICE, X-RAY INSPECTION METHOD, AND METHOD OF MAN...
Publication number
20180045660
Publication date
Feb 15, 2018
Nikon Corporation
Hirotomo YASHIMA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY APPARATUS AND STRUCTURE PRODUCTION METHOD
Publication number
20170219499
Publication date
Aug 3, 2017
Nikon Corporation
Toshihisa TANAKA
G01 - MEASURING TESTING
Information
Patent Application
OBSERVATION DEVICE AND OBSERVATION METHOD
Publication number
20140002814
Publication date
Jan 2, 2014
Nikon Corporation
Naoshi Sakaguchi
G01 - MEASURING TESTING
Information
Patent Application
OBSERVATION DEVICE AND OBSERVATION METHOD
Publication number
20110109738
Publication date
May 12, 2011
NIKON CORPORATION
Naoshi Sakaguchi
G01 - MEASURING TESTING
Information
Patent Application
MONITORING APPARATUS, MONITORING METHOD, INSPECTING APPARATUS AND I...
Publication number
20110064297
Publication date
Mar 17, 2011
Naoshi SAKAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus and surface inspection method
Publication number
20100053603
Publication date
Mar 4, 2010
Nikon Corporation
Naoshi Sakaguchi
G01 - MEASURING TESTING
Information
Patent Application
Edge inspection apparatus
Publication number
20090086196
Publication date
Apr 2, 2009
Nikon Corporation
Naoshi Sakaguchi
G01 - MEASURING TESTING