Naoshin Haque

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Computer assisted weak pattern detection and quantification system
- Patent number 11,688,052
- Issue date Jun 27, 2023
- KLA Corporation
- Naoshin Haque
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer assisted weak pattern detection and quantification system
- Patent number 10,740,888
- Issue date Aug 11, 2020
- KLA-Tencor Corporation
- Naoshin Haque
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer defect discovery
- Patent number 9,518,934
- Issue date Dec 13, 2016
- KLA-Tencor Corp.
- Hong Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Computer Assisted Weak Pattern Detection and Quantification System
- Publication number 20200372630
- Publication date Nov 26, 2020
- Naoshin Haque
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer Assisted Weak Pattern Detection and Quantification System
- Publication number 20170309009
- Publication date Oct 26, 2017
- KLA-Tencor Corporation
- Naoshin Haque
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Defect Discovery
- Publication number 20170076911
- Publication date Mar 16, 2017
- KLA-Tencor Corporation
- Hong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer Defect Discovery
- Publication number 20160123898
- Publication date May 5, 2016
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING