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Naota NAKAYAMA

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  • Derry, NH, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Circuits and methods for fault testing
    • Patent number 9,513,337
    • Issue date Dec 6, 2016
    • Allegro Microsystems, LLC
    • Glenn A. Forrest
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Rotation sensor
    • Patent number 8,164,324
    • Issue date Apr 24, 2012
    • Aisin Seiki Kabushiki Kaisha
    • Takashi Hara
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CIRCUITS AND METHODS FOR FAULT TESTING
    • Publication number 20130116945
    • Publication date May 9, 2013
    • ALLEGRO MICROSYSTEMS, INC.
    • Glenn A. Forrest
    • G01 - MEASURING TESTING
  • Information Patent Application

    ROTATION SENSOR
    • Publication number 20100013467
    • Publication date Jan 21, 2010
    • AISIN SEIKI KABUSHIKI KAISHA
    • Takashi HARA
    • G01 - MEASURING TESTING