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Naoto Hayashi
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Utsunomiya-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement apparatus for measuring transmittance distribution of o...
Patent number
7,956,994
Issue date
Jun 7, 2011
Canon Kabushiki Kaisha
Naoto Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Exposure apparatus and device fabrication method
Patent number
7,889,319
Issue date
Feb 15, 2011
Canon Kabushiki Kaisha
Naoto Hayashi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Measuring apparatus and a measuring method for measuring a polariza...
Patent number
7,548,077
Issue date
Jun 16, 2009
Canon Kabushiki Kaisha
Naoto Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus and measuring method
Patent number
7,532,019
Issue date
May 12, 2009
Canon Kabushiki Kaisha
Naoto Hayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT APPARATUS AND ADJUSTING METHOD THEREOF
Publication number
20160076881
Publication date
Mar 17, 2016
Canon Kabushiki Kaisha
Naoto Hayashi
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION APPARATUS, CALIBRATION METHOD, AND MEASUREMENT APPARATUS
Publication number
20140107958
Publication date
Apr 17, 2014
Canon Kabushiki Kaisha
Naoto Hayashi
G01 - MEASURING TESTING
Information
Patent Application
EXPOSURE APPARATUS AND DEVICE FABRICATION METHOD
Publication number
20090207400
Publication date
Aug 20, 2009
Canon Kabushiki Kaisha
Naoto Hayashi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING...
Publication number
20090109439
Publication date
Apr 30, 2009
Canon Kabushiki Kaisha
Naoto Hayashi
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS AND MEASURING METHOD
Publication number
20080043226
Publication date
Feb 21, 2008
Canon Kabushiki Kaisha
Naoto HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Measuring apparatus and measuring method
Publication number
20060170932
Publication date
Aug 3, 2006
Canon Kabushiki Kaisha
Naoto Hayashi
G01 - MEASURING TESTING