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Naoto Kaguchi

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device and semiconductor module
    • Patent number 12,302,616
    • Issue date May 13, 2025
    • Mitsubishi Electric Corporation
    • Naoto Kaguchi
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,998,436
    • Issue date May 4, 2021
    • Mitsubishi Electric Corporation
    • Jun Fujita
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Inspection device and inspection method
    • Patent number 10,802,047
    • Issue date Oct 13, 2020
    • Mitsubishi Electric Corporation
    • Naoto Kaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 9,627,571
    • Issue date Apr 18, 2017
    • Mitsubishi Electric Corporation
    • Naoto Kaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 9,627,383
    • Issue date Apr 18, 2017
    • Mitsubishi Electric Corporation
    • Naoto Kaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Wide band gap semiconductor device
    • Patent number 9,472,543
    • Issue date Oct 18, 2016
    • Mitsubishi Electric Corporation
    • Eisuke Suekawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Silicon carbide semiconductor device manufacturing method
    • Patent number 8,932,944
    • Issue date Jan 13, 2015
    • Mitsubishi Electric Corporation
    • Yoichiro Tarui
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Jig for semiconductor test
    • Patent number 8,860,451
    • Issue date Oct 14, 2014
    • Mitshubishi Electronic Corporation
    • Naoto Kaguchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 8,692,244
    • Issue date Apr 8, 2014
    • Mitsubishi Electric Corporation
    • Naoto Kaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Silicon carbide semiconductor device
    • Patent number 8,525,189
    • Issue date Sep 3, 2013
    • Mitsubishi Electric Corporation
    • Yoichiro Tarui
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MODULE
    • Publication number 20220406893
    • Publication date Dec 22, 2022
    • Mitsubishi Electric Corporation
    • Naoto KAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INSPECTION DEVICE AND INSPECTION METHOD
    • Publication number 20200141977
    • Publication date May 7, 2020
    • Mitsubishi Electric Corporation
    • Naoto KAGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20190393333
    • Publication date Dec 26, 2019
    • MITSUBISHI ELECTRIC CORPORATION
    • Jun FUJITA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20160163703
    • Publication date Jun 9, 2016
    • Mitsubishi Electric Corporation
    • Naoto KAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20150014705
    • Publication date Jan 15, 2015
    • Mitsubishi Electric Corporation
    • Naoto KAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    WIDE BAND GAP SEMICONDUCTOR DEVICE
    • Publication number 20150008450
    • Publication date Jan 8, 2015
    • Mitsubishi Electric Corporation
    • Eisuke SUEKAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
    • Publication number 20130309851
    • Publication date Nov 21, 2013
    • MITSUBISHI ELECTRIC CORPORATION
    • Yoichiro TARUI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    JIG FOR SEMICONDUCTOR TEST
    • Publication number 20120299613
    • Publication date Nov 29, 2012
    • MITSUBISHI ELECTRIC CORPORATION
    • Naoto KAGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SILICON CARBIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
    • Publication number 20120132924
    • Publication date May 31, 2012
    • Mitsubishi Electric Corporation
    • Yoichiro TARUI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20120104415
    • Publication date May 3, 2012
    • MITSUBISHI ELECTRONIC CORPORATION
    • Naoto KAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS