Membership
Tour
Register
Log in
Naoto Kume
Follow
Person
Yokohama-Shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Charged-particle trajectory measurement apparatus and charged-parti...
Patent number
11,977,192
Issue date
May 7, 2024
Kabushiki Kaisha Toshiba
Naoto Kume
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector
Patent number
10,295,681
Issue date
May 21, 2019
Kabushiki Kaisha Toshiba
Satomi Taguchi
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector
Patent number
10,209,371
Issue date
Feb 19, 2019
Kabushiki Kaisha Toshiba
Isao Takasu
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detection apparatus and radiation detection method
Patent number
9,927,536
Issue date
Mar 27, 2018
Kabushiki Kaisha Toshiba
Hidehiko Kuroda
G01 - MEASURING TESTING
Information
Patent Grant
Alpha ray observation device and alpha ray observation method
Patent number
9,910,163
Issue date
Mar 6, 2018
Kabushiki Kaisha Toshiba
Naoto Kume
G01 - MEASURING TESTING
Information
Patent Grant
Muon tracker and muon tracking method
Patent number
9,720,113
Issue date
Aug 1, 2017
Kabushiki Kaisha Toshiba
Kohichi Nakayama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inner image generating apparatus and method thereof
Patent number
9,423,361
Issue date
Aug 23, 2016
Kabushiki Kaisha Toshiba
Tsukasa Sugita
G01 - MEASURING TESTING
Information
Patent Grant
Radiation measurement apparatus
Patent number
9,383,455
Issue date
Jul 5, 2016
Kabushiki Kaisha Toshiba
Shunichiro Makino
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detection apparatus
Patent number
9,285,490
Issue date
Mar 15, 2016
Kabushiki Kaisha Toshiba
Naoto Kume
G01 - MEASURING TESTING
Information
Patent Grant
Light detection unit and alpha ray observation device
Patent number
9,279,889
Issue date
Mar 8, 2016
Kabushiki Kaisha Toshiba
Naoto Kume
G01 - MEASURING TESTING
Information
Patent Grant
Radiation measurement apparatus
Patent number
9,170,339
Issue date
Oct 27, 2015
Kabushiki Kaisha Toshiba
Yoshinori Satoh
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional radiation display device and two-dimensional radiat...
Patent number
9,086,498
Issue date
Jul 21, 2015
Kabushiki Kaisha Toshiba
Naoto Kume
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CHARGED-PARTICLE TRAJECTORY MEASUREMENT APPARATUS AND CHARGED-PARTI...
Publication number
20230029942
Publication date
Feb 2, 2023
Kabushiki Kaisha Toshiba
Naoto KUME
G01 - MEASURING TESTING
Information
Patent Application
CHARGED-PARTICLE MEASUREMENT APPARATUS AND CONTROL METHOD OF CHARGE...
Publication number
20230026295
Publication date
Jan 26, 2023
Kabushiki Kaisha Toshiba
Naoto KUME
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR
Publication number
20180156930
Publication date
Jun 7, 2018
KABUSHIKI KAISHA TOSHIBA
Satomi TAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR
Publication number
20180143329
Publication date
May 24, 2018
KABUSHIKI KAISHA TOSHIBA
Isao TAKASU
G01 - MEASURING TESTING
Information
Patent Application
ALPHA RAY OBSERVATION DEVICE AND ALPHA RAY OBSERVATION METHOD
Publication number
20170205513
Publication date
Jul 20, 2017
KABUSHIKI KAISHA TOSHIBA
Naoto KUME
G01 - MEASURING TESTING
Information
Patent Application
MUON TRACKER AND MUON TRACKING METHOD
Publication number
20160377747
Publication date
Dec 29, 2016
KABUSHIKI KAISHA TOSHIBA
Kohichi NAKAYAMA
G01 - MEASURING TESTING
Information
Patent Application
ALPHA RAY OBSERVATION APPARATUS, ALPHA RAY OBSERVATION SYSTEM AND A...
Publication number
20150369932
Publication date
Dec 24, 2015
KABUSHIKI KAISHA TOSHIBA
Naoto KUME
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION UNIT AND ALPHA RAY OBSERVATION DEVICE
Publication number
20150323681
Publication date
Nov 12, 2015
KABUSHIKI KAISHA TOSHIBA
Naoto KUME
G01 - MEASURING TESTING
Information
Patent Application
INNER IMAGE GENERATING APPARATUS AND METHOD THEREOF
Publication number
20150198542
Publication date
Jul 16, 2015
KABUSHIKI KAISHA TOSHIBA
Tsukasa SUGITA
G01 - MEASURING TESTING
Information
Patent Application
RADIATION MEASUREMENT APPARATUS
Publication number
20150117613
Publication date
Apr 30, 2015
KABUSHIKI KAISHA TOSHIBA
Yoshinori Satoh
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTION APPARATUS AND RADIATION DETECTON METHOD
Publication number
20150090889
Publication date
Apr 2, 2015
KABUSHIKI KAISHA TOSHIBA
Hidehiko KURODA
G01 - MEASURING TESTING
Information
Patent Application
TWO-DIMENSIONAL RADIATION DISPLAY DEVICE AND TWO-DIMENSIONAL RADIAT...
Publication number
20150030133
Publication date
Jan 29, 2015
KABUSHIKI KAISHA TOSHIBA
Naoto Kume
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTION APPARATUS
Publication number
20140252244
Publication date
Sep 11, 2014
KABUSHIKI KAISHA TOSHIBA
Naoto Kume
G01 - MEASURING TESTING
Information
Patent Application
RADIATION MEASUREMENT APPARATUS
Publication number
20140231646
Publication date
Aug 21, 2014
KABUSHIKI KAISHA TOSHIBA
Shunichiro Makino
G01 - MEASURING TESTING