Naoto Miki

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Itabashi-ku, JP

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Patents Grantslast 30 patents

Information Patent Grant
Rotary drive unit of a surveying instrument and a surveying instrument
- Patent number 9,335,168
- Issue date May 10, 2016
- Kabushiki Kaisha Topcon
- Jun-ichi Kodaira
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Distance measuring device
- Patent number 8,179,522
- Issue date May 15, 2012
- Kabushiki Kaisha Topcon
- Isao Minegishi
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device
- Patent number 7,474,388
- Issue date Jan 6, 2009
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Alignment method of micro-alignment members and device thereof
- Patent number 7,330,308
- Issue date Feb 12, 2008
- Kabushiki Kaisha Topcon
- Noriyasu Kiryu
- G02 - OPTICS
Information Patent Grant
Surface inspection method and surface inspection system
- Patent number 7,064,820
- Issue date Jun 20, 2006
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 6,104,481
- Issue date Aug 15, 2000
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Rotary Drive Unit Of A Surveying Instrument And A Surveying Instrument
- Publication number 20140196293
- Publication date Jul 17, 2014
- Kabushiki Kaisha TOPCON
- Jun-ichi Kodaira
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE
- Publication number 20120033197
- Publication date Feb 9, 2012
- Isao Minegishi
- G01 - MEASURING TESTING
Information Patent Application
Distance Measuring Device
- Publication number 20070263202
- Publication date Nov 15, 2007
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Alignment method of micro-alignment members and device thereof
- Publication number 20050200981
- Publication date Sep 15, 2005
- KABUSHIKI KAISHA TOPCON
- Noriyasu Kiryu
- G02 - OPTICS
Information Patent Application
Surface inspection method and surface inspection system
- Publication number 20030184744
- Publication date Oct 2, 2003
- Hisashi Isozaki
- G01 - MEASURING TESTING