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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automated analysis device, and method for conveying sample
Patent number
11,971,423
Issue date
Apr 30, 2024
HITACHI HIGH-TECH CORPORATION
Naoto Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis device and automatic analysis method
Patent number
11,946,941
Issue date
Apr 2, 2024
HITACHI HIGH-TECH CORPORATION
Chie Yabutani
G01 - MEASURING TESTING
Information
Patent Grant
Automated analysis device
Patent number
11,662,357
Issue date
May 30, 2023
Hitachi High-Technologies Corporation
Masashi Akutsu
G01 - MEASURING TESTING
Information
Patent Grant
Automated analyzer
Patent number
11,619,639
Issue date
Apr 4, 2023
Hitachi High-Technologies Corporation
Akihiro Yasui
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and method for washing sample-pipetting probe
Patent number
11,480,504
Issue date
Oct 25, 2022
HITACHI HIGH-TECH CORPORATION
Naoto Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
10,962,558
Issue date
Mar 30, 2021
HITACHI HIGH-TECH CORPORATION
Akihiro Yasui
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis device and automatic analysis method
Patent number
10,746,748
Issue date
Aug 18, 2020
HITACHI HIGH-TECH CORPORATION
Chie Yabutani
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis device
Patent number
10,466,261
Issue date
Nov 5, 2019
Hitachi High-Technologies Corporation
Minoru Sano
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
10,094,844
Issue date
Oct 9, 2018
Hitachi High-Technologies Corporation
Yoshiaki Saito
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor light-emitting apparatus and vehicle headlight
Patent number
10,024,511
Issue date
Jul 17, 2018
Stanley Electric Co., Ltd.
Naoto Suzuki
G02 - OPTICS
Information
Patent Grant
Automatic analyzer and method for washing sample-pipetting probe
Patent number
9,897,519
Issue date
Feb 20, 2018
Hitachi High-Technologies Corporation
Naoto Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,891,240
Issue date
Feb 13, 2018
Hitachi High-Technologies Corporation
Akihiro Yasui
G01 - MEASURING TESTING
Information
Patent Grant
Automatic transmission
Patent number
6,277,047
Issue date
Aug 21, 2001
Fuji Jukogyo Kabushiki Kaisha
Keiji Sato
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Patents Applications
last 30 patents
Information
Patent Application
Automatic Analyzer
Publication number
20240201215
Publication date
Jun 20, 2024
Hitachi High-Tech Corporation
Masashi FUKAYA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
Publication number
20240192234
Publication date
Jun 13, 2024
HITACHI HIGH-TECH CORPORATION
Chie YABUTANI
G01 - MEASURING TESTING
Information
Patent Application
Automated Analysis Device
Publication number
20230258672
Publication date
Aug 17, 2023
Hitachi High-Technologies Corporation
Masashi AKUTSU
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analyzer and Method of Operating Automatic Analyzer
Publication number
20220260601
Publication date
Aug 18, 2022
Hitachi High-Tech Corporation
Maki FURUKAWA
G01 - MEASURING TESTING
Information
Patent Application
DRUG DELIVERY COMPOSITION AND PHARMACEUTICAL COMPOSITION
Publication number
20220241422
Publication date
Aug 4, 2022
Nihon University
Takanori KANAZAWA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
AUTOMATED ANALYSIS DEVICE, AND METHOD FOR CONVEYING SAMPLE
Publication number
20210239721
Publication date
Aug 5, 2021
HITACHI HIGH-TECH CORPORATION
Naoto SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
Publication number
20200326353
Publication date
Oct 15, 2020
HITACHI HIGH-TECH CORPORATION
Chie YABUTANI
G01 - MEASURING TESTING
Information
Patent Application
Automated Analyzer
Publication number
20200292566
Publication date
Sep 17, 2020
Hitachi High-Technologies Corporation
Akihiro YASUI
G01 - MEASURING TESTING
Information
Patent Application
Automated Analysis Device
Publication number
20200271678
Publication date
Aug 27, 2020
Hitachi High-Technologies Corporation
Masashi AKUTSU
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE
Publication number
20180156702
Publication date
Jun 7, 2018
Hitachi High-Technologies Corporation
Naoto SUZUKI
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20180128847
Publication date
May 10, 2018
Hitachi High-Technologies Corporation
Akihiro Yasui
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
Publication number
20180080948
Publication date
Mar 22, 2018
Hitachi High-Technologies Corporation
Chie YABUTANI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE
Publication number
20170328925
Publication date
Nov 16, 2017
Hitachi High-Technologies Corporation
Minoru SANO
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR LIGHT-EMITTING APPARATUS AND VEHICLE HEADLIGHT
Publication number
20160146415
Publication date
May 26, 2016
Stanley Electric Co., Ltd
Naoto Suzuki
G02 - OPTICS
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20150204895
Publication date
Jul 23, 2015
Hitachi High-Technologies Corporation
Akihiro Yasui
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE
Publication number
20140363896
Publication date
Dec 11, 2014
Naoto Suzuki
G01 - MEASURING TESTING
Information
Patent Application
LIGHT-EMITTING BODY AND MANUFACTURING METHOD THEREOF, AND LIGHT-EMI...
Publication number
20140285994
Publication date
Sep 25, 2014
Stanley Electric Co., Ltd
Naoto Suzuki
F21 - LIGHTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20140170023
Publication date
Jun 19, 2014
Hitachi High-Technologies Corporation
Yoshiaki Saito
G01 - MEASURING TESTING