Naoya MAEDA

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Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer
- Patent number 9,618,504
- Issue date Apr 11, 2017
- SYSMEX CORPORATION
- Tsukasa Hirata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYTICAL APPARATUS SYSTEM, AND METHOD
- Publication number 20150276705
- Publication date Oct 1, 2015
- SYSMEX CORPORATION
- Naoya MAEDA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER, SAMPLE ANALYSIS METHOD, AND NON-TRANSITORY STORAGE...
- Publication number 20140295453
- Publication date Oct 2, 2014
- SYSMEX CORPORATION
- Tsukasa HIRATA
- G01 - MEASURING TESTING