Naoya Ochi

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Image measurement system and controller
- Patent number 10,313,569
- Issue date Jun 4, 2019
- OMRON Corporation
- Gaku Shiramizu
- G01 - MEASURING TESTING
Information Patent Grant
Slave unit, node unit, controllers and network system
- Patent number 6,944,575
- Issue date Sep 13, 2005
- Omron Corporation
- Shintaro Ueno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
IMAGE MEASUREMENT SYSTEM AND CONTROLLER
- Publication number 20170257540
- Publication date Sep 7, 2017
- Omron Corporation
- Gaku SHIRAMIZU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Slave unit, node unit, controllers and network system
- Publication number 20030004686
- Publication date Jan 2, 2003
- OMRON CORPORATION
- Shintaro Ueno
- G05 - CONTROLLING REGULATING