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Naoya SAITO
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Atsugi-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
X-ray inspection device
Patent number
10,292,251
Issue date
May 14, 2019
ANRITSU INFIVIS CO., LTD.
Toshiaki Kikuchi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
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Patent Application
X-RAY INSPECTION DEVICE
Publication number
20170171953
Publication date
Jun 15, 2017
ANRITSU INFIVIS CO., LTD.
Toshiaki KIKUCHI
G01 - MEASURING TESTING