Naoya SAITO

Person

  • Atsugi-shi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray inspection device

    • Patent number 10,292,251
    • Issue date May 14, 2019
    • ANRITSU INFIVIS CO., LTD.
    • Toshiaki Kikuchi
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY INSPECTION DEVICE

    • Publication number 20170171953
    • Publication date Jun 15, 2017
    • ANRITSU INFIVIS CO., LTD.
    • Toshiaki KIKUCHI
    • G01 - MEASURING TESTING