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Naoya Takada
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Hiroshima-ken, JP
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Patents Grants
last 30 patents
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Patent Grant
Non-contact board inspection probe
Patent number
6,373,258
Issue date
Apr 16, 2002
Naoya Takada
G01 - MEASURING TESTING
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Patent Grant
Non-contact board inspection probe
Patent number
6,201,398
Issue date
Mar 13, 2001
OHT Inc.
Naoya Takada
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Non-contact board inspection probe
Publication number
20010008377
Publication date
Jul 19, 2001
Naoya Takada
G01 - MEASURING TESTING