NAOYOSHI KAWAHARA

Person

TOKYO, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method, design apparatus, and design program of semiconductor devic...
- Patent number 8,513,033
- Issue date Aug 20, 2013
- Renesas Electronics Corporation
- Naoyoshi Kawahara
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 7,986,025
- Issue date Jul 26, 2011
- Renesas Electronics Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 7,863,744
- Issue date Jan 4, 2011
- Renesas Electronics Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device and fabrication method therefor
- Patent number 7,777,288
- Issue date Aug 17, 2010
- NEC Electronics Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device with temperature monitor members
- Patent number 7,741,692
- Issue date Jun 22, 2010
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 7,485,566
- Issue date Feb 3, 2009
- NEC Electronics Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device, method of manufacturing the same and met...
- Patent number 7,462,921
- Issue date Dec 9, 2008
- NEC Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit including a temperature monitor element and ther...
- Patent number 7,391,092
- Issue date Jun 24, 2008
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device
- Patent number 7,239,002
- Issue date Jul 3, 2007
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 6,521,505
- Issue date Feb 18, 2003
- NEC Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150108570
- Publication date Apr 23, 2015
- RENESAS ELECTRONICS CORPORATION
- Naoyoshi KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20110256710
- Publication date Oct 20, 2011
- RENESAS ELECTRONICS CORPORATION
- Naoyoshi KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DESIGN APPARATUS, AND DESIGN PROGRAM OF SEMICONDUCTOR DEVIC...
- Publication number 20110095374
- Publication date Apr 28, 2011
- RENESAS ELECTRONICS CORPORATION
- Naoyoshi KAWAHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20080211097
- Publication date Sep 4, 2008
- NEC Electronics Corporation
- Naoyoshi KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20080099889
- Publication date May 1, 2008
- NEC Electronics Corporation
- Naoyoshi KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing semiconductor device
- Publication number 20070082476
- Publication date Apr 12, 2007
- NEC Electronics Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit device
- Publication number 20050218471
- Publication date Oct 6, 2005
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit device
- Publication number 20050218470
- Publication date Oct 6, 2005
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit device, method of manufacturing the same and met...
- Publication number 20050221573
- Publication date Oct 6, 2005
- NEC ELECTRONICS CORPORATION
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit device and fabrication method therefor
- Publication number 20050173775
- Publication date Aug 11, 2005
- NEC Electronics Corporation
- Naoyoshi Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit device
- Publication number 20050161822
- Publication date Jul 28, 2005
- NEC Electronics Corporation
- Hiroaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20020025674
- Publication date Feb 28, 2002
- NAOYOSHI KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS

NAOYOSHI KAWAHARA

Person

Patents Grantslast 30 patents

Method, design apparatus, and design program of semiconductor devic...

Semiconductor device and method for manufacturing same

Semiconductor device and method for manufacturing same

Integrated circuit device and fabrication method therefor

Integrated circuit device with temperature monitor members

Method of manufacturing semiconductor device

Integrated circuit device, method of manufacturing the same and met...

Integrated circuit including a temperature monitor element and ther...

Integrated circuit device

Manufacturing method of semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

METHOD, DESIGN APPARATUS, AND DESIGN PROGRAM OF SEMICONDUCTOR DEVIC...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

Method of manufacturing semiconductor device

Integrated circuit device

Integrated circuit device

Integrated circuit device, method of manufacturing the same and met...

Integrated circuit device and fabrication method therefor

Integrated circuit device

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE