TREA

Naoyuki Fujimura

Follow

Person

  • Tokyo, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Gas analyzer
    • Patent number 10,908,082
    • Issue date Feb 2, 2021
    • Yokogawa Electric Corporation
    • Yoshitaka Kobayashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Laser gas analyzer
    • Patent number 9,671,333
    • Issue date Jun 6, 2017
    • Yokogawa Electric Corporation
    • Takaaki Hirata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Laser gas analyzer
    • Patent number 9,347,877
    • Issue date May 24, 2016
    • Yokogawa Electric Corporation
    • Takaaki Hirata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of and system for cleaning probes
    • Patent number 6,551,408
    • Issue date Apr 22, 2003
    • Ando Electric Co., Ltd.
    • Naoyuki Fujimura
    • B08 - CLEANING
  • Information Patent Grant

    Method of lining up micro-balls
    • Patent number 6,255,132
    • Issue date Jul 3, 2001
    • Ando Electric Co., Ltd.
    • Naoyuki Fujimura
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    GAS ANALYZER
    • Publication number 20190317018
    • Publication date Oct 17, 2019
    • YOKOGAWA ELECTRIC CORPORATION
    • Yoshitaka Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    GAS CONCENTRATION ANALYZER AND GAS CONCENTRATION ANALYSIS METHOD
    • Publication number 20160305870
    • Publication date Oct 20, 2016
    • YOKOGAWA ELECTRIC CORPORATION
    • Masaya OOYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    LASER GAS ANALYZER
    • Publication number 20150260646
    • Publication date Sep 17, 2015
    • YOKOGAWA ELECTRIC CORPORATION
    • Takaaki Hirata
    • G01 - MEASURING TESTING
  • Information Patent Application

    LASER GAS ANALYZER
    • Publication number 20150185144
    • Publication date Jul 2, 2015
    • YOKOGAWA ELECTRIC CORPORATION
    • Takaaki Hirata
    • G01 - MEASURING TESTING
  • Information Patent Application

    LASER GAS ANALYZER
    • Publication number 20130135619
    • Publication date May 30, 2013
    • YOKOGAWA ELECTRIC CORPORATION
    • Takaaki Hirata
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card and method of fabricating same
    • Publication number 20020061668
    • Publication date May 23, 2002
    • Naoyuki Fujimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card and a method of manufacturing the same
    • Publication number 20010054906
    • Publication date Dec 27, 2001
    • Naoyuki Fujimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method of and system for cleaning probes
    • Publication number 20010035196
    • Publication date Nov 1, 2001
    • Naoyuki Fujimura
    • G01 - MEASURING TESTING