Naoyuki Taketomi

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Tsukuba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement system using tracking-type laser interferometer and ret...
- Patent number 10,162,041
- Issue date Dec 25, 2018
- Mitutoyo Corporation
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Grant
Tracking type laser interferometer and method for resetting the same
- Patent number 7,872,733
- Issue date Jan 18, 2011
- Mitutoyo Corporation
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Grant
Optical axis polarization type laser interferometer
- Patent number 7,599,070
- Issue date Oct 6, 2009
- Mitutoyo Corporation
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating absolute distance of tracking laser interfero...
- Patent number 7,538,888
- Issue date May 26, 2009
- Mitutoyo Corporation
- Shinichi Hara
- G01 - MEASURING TESTING
Information Patent Grant
Optical-axis deflection type laser interferometer, calibration meth...
- Patent number 7,408,650
- Issue date Aug 5, 2008
- Mitutoyo Corporation
- Yasushi Ueshima
- G01 - MEASURING TESTING
Information Patent Grant
Laser tracking interferometer
- Patent number 7,388,674
- Issue date Jun 17, 2008
- Mitutoyo Corporation
- Shinichirou Yanaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM USING TRACKING-TYPE LASER INTERFEROMETER AND RET...
- Publication number 20160313436
- Publication date Oct 27, 2016
- MITUTOYO CORPORATION
- Naoyuki TAKETOMI
- G01 - MEASURING TESTING
Information Patent Application
TRACKING TYPE LASER INTERFEROMETER AND METHOD FOR RESETTING THE SAME
- Publication number 20080316497
- Publication date Dec 25, 2008
- Mitutoyo Corporation
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AXIS POLARIZATION TYPE LASER INTERFEROMETER
- Publication number 20080198387
- Publication date Aug 21, 2008
- MITUTOYO CORPORATION
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-AXIS DEFLECTION TYPE LASER INTERFEROMETER, CALIBRATION METH...
- Publication number 20080049211
- Publication date Feb 28, 2008
- Mitutoyo Corporation
- Yasushi Ueshima
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING ABSOLUTE DISTANCE OF TRACKING LASER INTERFERO...
- Publication number 20070268494
- Publication date Nov 22, 2007
- Mitutoyo Corporation
- Shinichi Hara
- G01 - MEASURING TESTING
Information Patent Application
LASER TRACKING INTERFEROMETER
- Publication number 20070024861
- Publication date Feb 1, 2007
- Mitutoyo Corporation
- Shinichirou Yanaka
- G01 - MEASURING TESTING