Naoyuki Taketoshi

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Ibaraki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring fast time response using fast pulse and system...
- Patent number 7,044,636
- Issue date May 16, 2006
- National Institute of Advanced Industrial Science and Technology
- Naoyuki Taketoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thermophysical properties
- Patent number 6,595,685
- Issue date Jul 22, 2003
- National Research Laboratory of Metrology
- Tetsuya Baba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for measuring thermophysical property of thin film and appar...
- Publication number 20050002436
- Publication date Jan 6, 2005
- Naoyuki Taketoshi
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring fast time response using fast pulse and system...
- Publication number 20030202556
- Publication date Oct 30, 2003
- Naoyuki Taketoshi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING THERMOPHYSICAL PROPERTIES
- Publication number 20020131476
- Publication date Sep 19, 2002
- TETSUYA BABA
- G01 - MEASURING TESTING