Naoyuki Yoshida

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Kobe, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of and apparatus for measuring lifetime of carriers in semic...
- Patent number 5,760,597
- Issue date Jun 2, 1998
- Kabushiki Kaisha Kobe Seiko Sho
- Naoyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method of sample valuation based on the measurement of photothermal...
- Patent number 5,619,326
- Issue date Apr 8, 1997
- Kabushiki Kaisha Kobe Seiko Sho
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING