Narayanan Vijayaraghavan

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Delhi, IN

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Patents Grantslast 30 patents

Information Patent Grant
Flexible on chip testing circuit for I/O's characterization
- Patent number 7,772,833
- Issue date Aug 10, 2010
- STMicroelectronics Pvt. Ltd.
- Narayanan Vijayaraghavan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring maximum operating frequency and cor...
- Patent number 7,710,101
- Issue date May 4, 2010
- STMicroelectronics Pvt. Ltd.
- Vijayaraghavan Narayanan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FLEXIBLE ON CHIP TESTING CIRCUIT FOR I/O'S CHARACTERIZATION
- Publication number 20090076753
- Publication date Mar 19, 2009
- STMicroelectronics Pvt. Ltd.
- Narayanan Vijayaraghavan
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE ON CHIP TESTING CIRCUIT FOR I/O'S CHARACTERIZATION
- Publication number 20080231310
- Publication date Sep 25, 2008
- STMICROELECTRONICS PVT. LTD.
- Narayanan Vijayaraghavan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING MAXIMUM OPERATING FREQUENCY AND COR...
- Publication number 20080030186
- Publication date Feb 7, 2008
- STMICROELECTRONICS PVT. LTD.
- Vijayaraghavan NARAYANAN
- G01 - MEASURING TESTING