Narender Rana

Person

Highland, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated hybrid metrology for semiconductor device fabrication
- Patent number 9,330,985
- Issue date May 3, 2016
- GLOBALFOUNDRIES, INC.
- Alok Vaid
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for estimating spatial characteristics of integra...
- Patent number 9,262,819
- Issue date Feb 16, 2016
- GLOBALFOUNDRIES, INC.
- Taher E. Kagalwala
- G01 - MEASURING TESTING
Information Patent Grant
Liner protection in deep trench etching
- Patent number 8,030,157
- Issue date Oct 4, 2011
- International Business Machines Corporation
- Habib Hichri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ high-resolution light-optical channel for optical viewing a...
- Patent number 7,781,733
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution optical channel for non-destructive navigation and...
- Patent number 7,351,966
- Issue date Apr 1, 2008
- International Business Machines Corporation
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector for ion beam applications
- Patent number 7,119,333
- Issue date Oct 10, 2006
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING
- Publication number 20140073114
- Publication date Mar 13, 2014
- GLOBALFOUNDRIES INC.
- Cheng Cen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED HYBRID METROLOGY FOR SEMICONDUCTOR DEVICE FABRICATION
- Publication number 20130245806
- Publication date Sep 19, 2013
- International Business Machines Corporation
- Alok Vaid
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING
- Publication number 20130200501
- Publication date Aug 8, 2013
- GLOBALFOUNDRIES INC.
- Cheng Cen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID METROLOGY FOR SEMICONDUCTOR DEVICES
- Publication number 20130203188
- Publication date Aug 8, 2013
- GLOBALFOUNDRIES INC.
- Alok Vaid
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU HIGH-RESOLUTION LIGHT-OPTICAL CHANNEL FOR OPTICAL VIEWING A...
- Publication number 20080283777
- Publication date Nov 20, 2008
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-RESOLUTION OPTICAL CHANNEL FOR NON-DESTRUCTIVE NAVIGATION AND...
- Publication number 20080067369
- Publication date Mar 20, 2008
- International Business Machines Corporation
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED ION DETECTOR FOR IONBEAM APPLICATIONS
- Publication number 20060097159
- Publication date May 11, 2006
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS

Narender Rana

Person

Patents Grantslast 30 patents

Automated hybrid metrology for semiconductor device fabrication

System and method for estimating spatial characteristics of integra...

Liner protection in deep trench etching

In-situ high-resolution light-optical channel for optical viewing a...

High-resolution optical channel for non-destructive navigation and...

Ion detector for ion beam applications

Patents Applicationslast 30 patents

IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING

AUTOMATED HYBRID METROLOGY FOR SEMICONDUCTOR DEVICE FABRICATION

IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING

HYBRID METROLOGY FOR SEMICONDUCTOR DEVICES

IN-SITU HIGH-RESOLUTION LIGHT-OPTICAL CHANNEL FOR OPTICAL VIEWING A...

HIGH-RESOLUTION OPTICAL CHANNEL FOR NON-DESTRUCTIVE NAVIGATION AND...

IMPROVED ION DETECTOR FOR IONBEAM APPLICATIONS