Narendra B. Devta-Prasa

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test technique to apply a variable scan clock including a scan cloc...
- Patent number 8,418,008
- Issue date Apr 9, 2013
- LSI Corporation
- Sreejit Chakravarty
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DFT TECHNIQUE TO APPLY A VARIABLE SCAN CLOCK INCLUDING A SCAN CLOCK...
- Publication number 20100162060
- Publication date Jun 24, 2010
- LSI Corporation
- Sreejit Chakravarty
- G01 - MEASURING TESTING