Nariaki Fujiwara

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring apparatus
- Patent number 7,012,702
- Issue date Mar 14, 2006
- Dainippon Screen Mfg. Co., Ltd.
- Nariaki Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Grinding process monitoring system and grinding process monitoring...
- Patent number 6,000,996
- Issue date Dec 14, 1999
- Dainippon Screen Mfg. Co., Ltd.
- Nariaki Fujiwara
- B24 - GRINDING POLISHING
Information Patent Grant
Optical measuring apparatus and optical measuring method
- Patent number 5,715,061
- Issue date Feb 3, 1998
- Dainippon Screen Mfg. Co., Ltd.
- Nariaki Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring film thicknesses
- Patent number 5,493,401
- Issue date Feb 20, 1996
- Dainippon Screen Mfg. Co., Ltd.
- Masahiro Horie
- G01 - MEASURING TESTING
Information Patent Grant
Reflected light measuring method and reflected light measuring appa...
- Patent number 5,422,703
- Issue date Jun 6, 1995
- Dainippon Screen Mfg. Co., Ltd.
- Masahiro Horie
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detection system
- Patent number 5,251,011
- Issue date Oct 5, 1993
- Dainippon Screen Manufacturing Co., Ltd.
- Nariaki Fujiwara
- G02 - OPTICS
Information Patent Grant
Method of focusing optical head on object body and automatic focusi...
- Patent number 5,136,149
- Issue date Aug 4, 1992
- Dainippon Screen Mfg. Co., Ltd.
- Nariaki Fujiwara
- G02 - OPTICS
Information Patent Grant
Microspectroscope
- Patent number 5,048,960
- Issue date Sep 17, 1991
- Dainippon Screen Mfg. Co., Ltd.
- Takahisa Hayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE ACQUISITION APPARATUS, PATTERN INSPECTION APPARATUS, AND IMAG...
- Publication number 20120307041
- Publication date Dec 6, 2012
- Nariaki FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
Film detection apparatus for detecting organic film formed on print...
- Publication number 20060023936
- Publication date Feb 2, 2006
- Dainippon Screen Mfg. Co., Ltd.
- Nariaki Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measuring apparatus
- Publication number 20030133133
- Publication date Jul 17, 2003
- Dainippon Screen Mfg. Co., Ltd.
- Nariaki Fujiwara
- G01 - MEASURING TESTING

Nariaki Fujiwara

Person

Patents Grantslast 30 patents

Measuring apparatus

Grinding process monitoring system and grinding process monitoring...

Optical measuring apparatus and optical measuring method

Method of measuring film thicknesses

Reflected light measuring method and reflected light measuring appa...

Displacement detection system

Method of focusing optical head on object body and automatic focusi...

Microspectroscope

Patents Applicationslast 30 patents

IMAGE ACQUISITION APPARATUS, PATTERN INSPECTION APPARATUS, AND IMAG...

Film detection apparatus for detecting organic film formed on print...

Measuring apparatus