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Narjes JAVAHERI
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Eindhoven, NL
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Patents Grants
last 30 patents
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Patent Grant
Metrology method and associated computer product
Patent number
12,105,432
Issue date
Oct 1, 2024
ASML Netherlands B.V.
Narjes Javaheri
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology parameter determination and metrology recipe selection
Patent number
11,448,974
Issue date
Sep 20, 2022
ASML Netherlands B.V.
Narjes Javaheri
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology parameter determination and metrology recipe selection
Patent number
10,990,020
Issue date
Apr 27, 2021
ASML Netherlands B.V.
Narjes Javaheri
G01 - MEASURING TESTING
Information
Patent Grant
Metrology method and apparatus, computer program and lithographic s...
Patent number
10,705,437
Issue date
Jul 7, 2020
ASML Netherlands B.V.
Narjes Javaheri
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DIGITAL TWIN CALIBRATION
Publication number
20250238571
Publication date
Jul 24, 2025
FEI Electron Optics B.V.
Narjes JAVAHERI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE
Publication number
20250131552
Publication date
Apr 24, 2025
ASML NETHERLANDS B.V.
Shahrzad NAGHIBZADEH
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METROLOGY METHOD AND ASSOCIATED COMPUTER PRODUCT
Publication number
20220252990
Publication date
Aug 11, 2022
ASML Netherlands B,V.
Narjes JAVAHERI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION
Publication number
20210208513
Publication date
Jul 8, 2021
ASML NETHERLANDS B.V.
Narjes JAVAHERI
G01 - MEASURING TESTING
Information
Patent Application
Metrology Method and Apparatus, Computer Program and Lithographic S...
Publication number
20190107785
Publication date
Apr 11, 2019
ASML NETHERLANDS B.V.
Narjes JAVAHERI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION
Publication number
20180321597
Publication date
Nov 8, 2018
ASML NETHERLANDS B.V.
Narjes JAVAHERI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY