Nat Ceglio

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inspection of a specimen using different in...
- Patent number 8,384,887
- Issue date Feb 26, 2013
- KLA-Tencor Technologies Corp.
- Steve R. Lange
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for inspection of a specimen using different in...
- Patent number 7,738,089
- Issue date Jun 15, 2010
- KLA-Tencor Technologies Corp.
- Steve R. Lange
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing bright field and dark field optica...
- Patent number 7,259,869
- Issue date Aug 21, 2007
- KLA-Tencor Technologies Corporation
- Shiow-Hwei Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus using microscopic and interferometric based de...
- Patent number 7,095,507
- Issue date Aug 22, 2006
- KLA-Tencor Technologies Corporation
- Shiow-Hwei Hwang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF A SPECIMEN USING DIFFERENT IN...
- Publication number 20100238433
- Publication date Sep 23, 2010
- KLA-Tencor Technologies Corporation
- Steve R. Lange
- G01 - MEASURING TESTING
Information Patent Application
System and method for performing bright field and dark field optica...
- Publication number 20060007448
- Publication date Jan 12, 2006
- Shiow-Hwei Hwang
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for inspection of a specimen using different in...
- Publication number 20050052643
- Publication date Mar 10, 2005
- Steve R. Lange
- G01 - MEASURING TESTING