Natalia Malkova

Person

Hayward, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement methodology of advanced nanostructures
- Patent number 11,156,548
- Issue date Oct 26, 2021
- KLA-Tencor Corporation
- Manh Nguyen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Multi-dimensional model of optical dispersion
- Patent number 11,060,982
- Issue date Jul 13, 2021
- KLA Corporation
- Natalia Malkova
- G01 - MEASURING TESTING
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 10,770,362
- Issue date Sep 8, 2020
- KLA Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer film metrology using an effective media approximation
- Patent number 10,429,296
- Issue date Oct 1, 2019
- KLA-Tencor Corporation
- Mark A. Neil
- G02 - OPTICS
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 10,410,935
- Issue date Sep 10, 2019
- KLA-Tencor Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-oscillator, continuous Cody-Lorentz model of optical dispersion
- Patent number 9,664,734
- Issue date May 30, 2017
- KLA-Tencor Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 9,595,481
- Issue date Mar 14, 2017
- KLA-Tencor Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Model for optical dispersion of high-K dielectrics including defects
- Patent number 9,405,290
- Issue date Aug 2, 2016
- KLA-Tencor Corporation
- Natalia Malkova
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
TRANSISTOR CHANNEL STRESS AND MOBILITY METROLOGY USING MULTIPASS SP...
- Publication number 20250146893
- Publication date May 8, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
Multi-Dimensional Model Of Optical Dispersion
- Publication number 20200292467
- Publication date Sep 17, 2020
- KLA Corporation
- Natalia Malkova
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement Methodology of Advanced Nanostructures
- Publication number 20190178788
- Publication date Jun 13, 2019
- KLA-Tencor Corporation
- Manh Nguyen
- G05 - CONTROLLING REGULATING
Information Patent Application
Multilayer Film Metrology Using An Effective Media Approximation
- Publication number 20190033211
- Publication date Jan 31, 2019
- KLA-Tencor Corporation
- Mark A. Neil
- G02 - OPTICS
Information Patent Application
Multi-Oscillator, Continuous Cody-Lorentz Model Of Optical Dispersion
- Publication number 20160341792
- Publication date Nov 24, 2016
- KLA-Tencor Corporation
- Natalia Malkova
- G01 - MEASURING TESTING

Natalia Malkova

Person

Patents Grantslast 30 patents

Measurement methodology of advanced nanostructures

Multi-dimensional model of optical dispersion

Dispersion model for band gap tracking

Multilayer film metrology using an effective media approximation

Dispersion model for band gap tracking

Multi-oscillator, continuous Cody-Lorentz model of optical dispersion

Dispersion model for band gap tracking

Model for optical dispersion of high-K dielectrics including defects

Patents Applicationslast 30 patents

TRANSISTOR CHANNEL STRESS AND MOBILITY METROLOGY USING MULTIPASS SP...

Multi-Dimensional Model Of Optical Dispersion

Measurement Methodology of Advanced Nanostructures

Multilayer Film Metrology Using An Effective Media Approximation

Multi-Oscillator, Continuous Cody-Lorentz Model Of Optical Dispersion