Nathan D. Jack

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Gate-all-around integrated circuit structures having devices with s...
- Patent number 11,908,856
- Issue date Feb 20, 2024
- Intel Corporation
- Biswajeet Guha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate-all-around integrated circuit structures having adjacent deep...
- Patent number 11,837,641
- Issue date Dec 5, 2023
- Intel Corporation
- Biswajeet Guha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate-all-around integrated circuit structures having devices with c...
- Patent number 11,824,116
- Issue date Nov 21, 2023
- Intel Corporation
- Biswajeet Guha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate-less FinFET diode architectures with backside metal conta...
- Patent number 11,652,107
- Issue date May 16, 2023
- Intel Corporation
- Nicholas Thomson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor diodes employing back-side semiconductor or metal
- Patent number 11,264,405
- Issue date Mar 1, 2022
- Intel Corporation
- Patrick Morrow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for dynamic biasing to improve ESD robustness...
- Patent number 10,756,078
- Issue date Aug 25, 2020
- International Business Machines Corporation
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit protection during high-current ESD testing
- Patent number 10,359,461
- Issue date Jul 23, 2019
- International Business Machines Corporation
- Shunhua Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for dynamic biasing to improve ESD robustness...
- Patent number 10,181,463
- Issue date Jan 15, 2019
- International Business Machines Corporation
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit protection during high-current ESD testing
- Patent number 9,869,708
- Issue date Jan 16, 2018
- International Business Machines Corporation
- Shunhua Chang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Structure and method for dynamic biasing to improve ESD robustness...
- Patent number 9,620,497
- Issue date Apr 11, 2017
- International Business Machines Corporation
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Integrated circuit protection during high-current ESD testing
- Patent number 9,435,841
- Issue date Sep 6, 2016
- International Business Machines Corporation
- Shunhua Chang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Structure and method for dynamic biasing to improve ESD robustness...
- Patent number 9,219,055
- Issue date Dec 22, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH S...
- Publication number 20240145471
- Publication date May 2, 2024
- Intel Corporation
- Biswajeet GUHA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING ADJACENT DEEP...
- Publication number 20240055497
- Publication date Feb 15, 2024
- Intel Corporation
- Biswajeet GUHA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH C...
- Publication number 20240038889
- Publication date Feb 1, 2024
- Intel Corporation
- Biswajeet GUHA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERAL DIODES IN STACKED TRANSISTOR TECHNOLOGIES
- Publication number 20230087444
- Publication date Mar 23, 2023
- Intel Corporation
- Nicholas A. Thomson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL DIODES IN STACKED TRANSISTOR TECHNOLOGIES
- Publication number 20230089395
- Publication date Mar 23, 2023
- Intel Corporation
- Benjamin Orr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERAL DIODES IN STACKED TRANSISTOR TECHNOLOGIES
- Publication number 20230088578
- Publication date Mar 23, 2023
- Intel Corporation
- Nicholas A. Thomson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE-LESS SILICON CONTROLLED RECTIFIER (SCR) INTEGRATED CIRCUI...
- Publication number 20220415881
- Publication date Dec 29, 2022
- Intel Corporation
- Rui MA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE-LESS LATERAL DIODE INTEGRATED CIRCUIT STRUCTURES
- Publication number 20220415925
- Publication date Dec 29, 2022
- Intel Corporation
- Nicholas THOMSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE-LESS NANOWIRE-BASED LATERAL DIODE INTEGRATED CIRCUIT STRU...
- Publication number 20220416022
- Publication date Dec 29, 2022
- Intel Corporation
- Nicholas THOMSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION DIODE FOR BACK-SIDE POWER DELIVE...
- Publication number 20220415877
- Publication date Dec 29, 2022
- Intel Corporation
- Benjamin Orr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE-LESS DIODE, BIPOLAR AND FEEDTHROUGH INTEGRATED CIRCUIT ST...
- Publication number 20220415880
- Publication date Dec 29, 2022
- Intel Corporation
- Ayan KAR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE-FREE INTEGRATED CIRCUIT STRUCTURES
- Publication number 20220102385
- Publication date Mar 31, 2022
- Intel Corporation
- Biswajeet GUHA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH S...
- Publication number 20210193652
- Publication date Jun 24, 2021
- Intel Corporation
- Biswajeet GUHA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING ADJACENT DEEP...
- Publication number 20210193807
- Publication date Jun 24, 2021
- Intel Corporation
- Biswajeet GUHA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH C...
- Publication number 20210193836
- Publication date Jun 24, 2021
- Intel Corporation
- Biswajeet GUHA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE-LESS FINFET DIODE ARCHITECTURES WITH BACKSIDE METAL CONTA...
- Publication number 20200403007
- Publication date Dec 24, 2020
- Intel Corporation
- Nicholas THOMSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATCHUP GUARD RING GRID
- Publication number 20200194421
- Publication date Jun 18, 2020
- Nathan JACK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DIODES EMPLOYING BACK-SIDE SEIMCONDUCTOR OR METAL
- Publication number 20190096917
- Publication date Mar 28, 2019
- Intel Corporation
- Patrick Morrow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING
- Publication number 20180100883
- Publication date Apr 12, 2018
- International Business Machines Corporation
- SHUNHUA CHANG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING
- Publication number 20180100884
- Publication date Apr 12, 2018
- International Business Machines Corporation
- SHUNHUA CHANG
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...
- Publication number 20170133839
- Publication date May 11, 2017
- International Business Machines Corporation
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING
- Publication number 20160033564
- Publication date Feb 4, 2016
- International Business Machines Corporation
- SHUNHUA CHANG
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...
- Publication number 20150364914
- Publication date Dec 17, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...
- Publication number 20150363539
- Publication date Dec 17, 2015
- International Business Machines Corporation
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INVERTER-EMBEDDED SILICON CONTROLLED RECTIFIER
- Publication number 20150124360
- Publication date May 7, 2015
- Nathan D. Jack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...
- Publication number 20130335099
- Publication date Dec 19, 2013
- International Business Machines Corporation
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING
- Publication number 20130271883
- Publication date Oct 17, 2013
- International Business Machines Corporation
- Shunhua Chang
- G01 - MEASURING TESTING

Nathan D. Jack

Person

Patents Grantslast 30 patents

Gate-all-around integrated circuit structures having devices with s...

Gate-all-around integrated circuit structures having adjacent deep...

Gate-all-around integrated circuit structures having devices with c...

Substrate-less FinFET diode architectures with backside metal conta...

Semiconductor diodes employing back-side semiconductor or metal

Structure and method for dynamic biasing to improve ESD robustness...

Integrated circuit protection during high-current ESD testing

Structure and method for dynamic biasing to improve ESD robustness...

Integrated circuit protection during high-current ESD testing

Structure and method for dynamic biasing to improve ESD robustness...

Integrated circuit protection during high-current ESD testing

Structure and method for dynamic biasing to improve ESD robustness...

Patents Applicationslast 30 patents

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH S...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING ADJACENT DEEP...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH C...

LATERAL DIODES IN STACKED TRANSISTOR TECHNOLOGIES

VERTICAL DIODES IN STACKED TRANSISTOR TECHNOLOGIES

LATERAL DIODES IN STACKED TRANSISTOR TECHNOLOGIES

SUBSTRATE-LESS SILICON CONTROLLED RECTIFIER (SCR) INTEGRATED CIRCUI...

SUBSTRATE-LESS LATERAL DIODE INTEGRATED CIRCUIT STRUCTURES

SUBSTRATE-LESS NANOWIRE-BASED LATERAL DIODE INTEGRATED CIRCUIT STRU...

ELECTROSTATIC DISCHARGE PROTECTION DIODE FOR BACK-SIDE POWER DELIVE...

SUBSTRATE-LESS DIODE, BIPOLAR AND FEEDTHROUGH INTEGRATED CIRCUIT ST...

SUBSTRATE-FREE INTEGRATED CIRCUIT STRUCTURES

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH S...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING ADJACENT DEEP...

GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEVICES WITH C...

SUBSTRATE-LESS FINFET DIODE ARCHITECTURES WITH BACKSIDE METAL CONTA...

LATCHUP GUARD RING GRID

SEMICONDUCTOR DIODES EMPLOYING BACK-SIDE SEIMCONDUCTOR OR METAL

INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING

INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING

STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...

INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING

STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...

STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...

INVERTER-EMBEDDED SILICON CONTROLLED RECTIFIER

STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...

INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING